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pro vyhledávání: '"Roman Padilla-Alvarez"'
Publikováno v:
Journal of Analytical Atomic Spectrometry. 38:174-185
Angle resolved XRF (AR-XRF) is an analytical technique in which the sample is analyzed at different angles of detection or irradiation. The change in the geometry affects the intensity of the elemental characteristic emission from the sample, which d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ba3b6b71a688d1e51ddb1f175c63b767
https://doi.org/10.1039/d2ja00227b
https://doi.org/10.1039/d2ja00227b
