Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Roman A. Kunitsyn"'
Publikováno v:
Key Engineering Materials. 910:871-879
The article considers the possibility of applying the eddy current method of non-destructive testing for measuring the electrical conductivity of new material - thin metal films. Copper films of various thickness obtained by physical vapour depositio
Antiferromagnetic (AFM) materials with zero or vanishingly small macroscopic magnetization are nowadays the constituent elements of spintronic devices. However, possibility to use them as active elements that show nontrivial controllable magnetic dyn
Externí odkaz:
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