Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Romain Debroucke"'
Autor:
Frederic Gianesello, Daniel Gloria, Fabien Ferrero, Diane Titz, Sébastien Jan, Gilles Jacquemod, Cyril Luxey, Romain Pilard, Romain Debroucke
Publikováno v:
Microwave and Optical Technology Letters
Microwave and Optical Technology Letters, Wiley, 2014, 54 (10), pp.2221-2223. ⟨10.1002/mop.27079⟩
Microwave and Optical Technology Letters, 2014, 54 (10), pp.2221-2223. ⟨10.1002/mop.27079⟩
Microwave and Optical Technology Letters, Wiley, 2014, 54 (10), pp.2221-2223. ⟨10.1002/mop.27079⟩
Microwave and Optical Technology Letters, 2014, 54 (10), pp.2221-2223. ⟨10.1002/mop.27079⟩
In this article, we present the design and the measurement of two hybrid couplers for millimeter-wave applications realized in the BiCMOS9MW 130nm process (ST Microelectronics). The aim is to demonstrate several miniaturization possibilities of a con
Autor:
Diane Titz, Romain Debroucke, Cyril Luxey, Romain Pilard, Daniel Gloria, Fabien Ferrero, Frederic Gianesello, Gilles Jacquemod
Publikováno v:
2011 IEEE 9th International New Circuits and systems conference.
In this paper, we present the design, the realization and the measurement of a Reflection-Type Phase Shifter (RTPS) realized in the BiCMOS9MW 130nm process from ST Microelectronics dedicated to millimeter wave applications. The aim of this work is to
Autor:
Christophe Gaquiere, Hassan Tanbakuchi, Romain Debroucke, Damien Ducatteau, Daniel Gloria, Didier Theron
Publikováno v:
Proceedings of 77th ARFTG Microwave Measurement Conference
77th ARFTG Microwave Measurement Conference
77th ARFTG Microwave Measurement Conference, 2011, Baltimore, MD, United States. pp.1-2, ⟨10.1109/ARFTG77.2011.6034572⟩
77th ARFTG Microwave Measurement Conference
77th ARFTG Microwave Measurement Conference, 2011, Baltimore, MD, United States. pp.1-2, ⟨10.1109/ARFTG77.2011.6034572⟩
Nowadays with capabilities offered by advanced silicon technologies both for design above 60GHz and for high performance Digitally Controlled Oscillator, the use of sub fF varactor is mandatory. One of the challenge to develop this device is to be ab
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1edc20d0de7e8d21f52f30b1aedc7dca
https://hal.archives-ouvertes.fr/hal-00800124
https://hal.archives-ouvertes.fr/hal-00800124
Autor:
Cyril Luxey, A. Pottrain, Daniel Gloria, Romain Debroucke, Frederic Gianesello, Christophe Gaquiere, Diane Titz
Publikováno v:
Proceedings of 2011 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2011
IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2011
IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2011, 2011, Baltimore, MD, United States. pp.1-4, ⟨10.1109/RFIC.2011.5940648⟩
IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2011
IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2011, 2011, Baltimore, MD, United States. pp.1-4, ⟨10.1109/RFIC.2011.5940648⟩
Nowadays capabilities offered by advanced silicon technologies enable both mmw design and agile circuits development, then the development of high performance tunable capacitance is now mandatory. One of the challenge to develop this component is to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fed204445e14233b46af9d4c4cda1ed4
https://hal.archives-ouvertes.fr/hal-00800111
https://hal.archives-ouvertes.fr/hal-00800111
Publikováno v:
Proceedings of 24th IEEE International Conference on Microelectronic Test Structures, ICMTS 2011
24th IEEE International Conference on Microelectronic Test Structures, ICMTS 2011
24th IEEE International Conference on Microelectronic Test Structures, ICMTS 2011, 2011, Amsterdam, Netherlands. pp.101-104, ⟨10.1109/ICMTS.2011.5976868⟩
24th IEEE International Conference on Microelectronic Test Structures, ICMTS 2011
24th IEEE International Conference on Microelectronic Test Structures, ICMTS 2011, 2011, Amsterdam, Netherlands. pp.101-104, ⟨10.1109/ICMTS.2011.5976868⟩
Nowadays, thanks to the capabilities offered by advanced CMOS and BiCMOS technologies for the design above 60GHz, the improvement of millimeter wave varactors is mandatory. Innovative test structures must be designed to characterize these varactors w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::87b0909aec43d84e0f5e4b66dc24b116
https://hal.archives-ouvertes.fr/hal-00800125
https://hal.archives-ouvertes.fr/hal-00800125