Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Rolf Geilenkeuser"'
Autor:
Jörg-Oliver Weidner, Lutz Herrmann, T. Mantei, Falk Graetsch, Rolf Geilenkeuser, Karsten Wieczorek
Publikováno v:
Materials Science and Engineering: B. 118:50-54
Appropriate balancing of the polysilicon dopant concentration and the physical gate dielectric thickness is required so as to accomplish a minimized capacitance equivalent thickness (CET) at low gate leakage (JG) and high reliability. Here, we invest
Autor:
M. Majer, Maciej Wiatr, S. J. Wong, Casey Scott, V. Shah, D. Greenlaw, Rolf Geilenkeuser, T. Rodes, Karsten Wieczorek, Tilo Mantei, Richard Heller, Manfred Horstmann, E. Pruefer, Jan Hoentschel
Publikováno v:
2009 IEEE International Reliability Physics Symposium.
The impact of HCI and NBTI on device DC, Ring Oscillator (RO) AC as well as on the degradation of product operating frequency (F MAX ) has been extensively studied. We have developed a method, which allows the compensation of HCI/NBTI-related device
Autor:
V. Samohvalov, Falk Graetsch, Martin Trentzsch, B. Bayha, T. Schink, Rolf Geilenkeuser, Karsten Wieczorek, T. Paetzold
Publikováno v:
2008 IEEE International Integrated Reliability Workshop Final Report.
In the presented work we demonstrate an efficient way to improve the balance between performance and reliability in the case that microprocessor speed is limited by a pMOS dominated speed path. It is shown that with differential targeted, thicker pMO
Autor:
Rolf Geilenkeuser
Publikováno v:
MRS Bulletin. 34:133-133
Publikováno v:
Czechoslovak Journal of Physics. 46:2251-2252
We measured the thermal conductivity λ of Polycarbonat (PC) in the temperature range from 3 K to 150 K under application of hydrostatic pressure up to 1.3 GPa. A strong influence of pressure on λ was observed over the entire temperature range. An a
Publikováno v:
Scopus-Elsevier
The thermal conductivity λ of polycarbonate (PC) has been measured in the temperature range 3–150 K under hydrostatic pressure up to 1.3 GPa [Geilenkeuser, R., Weise, F. and Jackel, M., Czech. J. Physics , 1996, 46, 2251 ( Proc. LT 21 , Prag, Augu
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