Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Roland Sleik"'
Publikováno v:
IEEE Transactions on Industry Applications. 53:5698-5708
Reliability stress testing of power semiconductors requires significant development effort for a test apparatus to provide the required functionality. This paper presents a modular test system (MTS) architecture that focuses on flexibility, reusabili
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::24ea78fa3efa57a73dbfbf478b0ef92e
https://doi.org/10.1109/tia.2017.2724501
https://doi.org/10.1109/tia.2017.2724501
Autor:
Yevhen Nikitin, Annette Muetze, Roland Sleik, Klaus Krischan, Marco Di Bernardo, Michael Glavanovics
Publikováno v:
2017 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe).
Today, performing life tests on power semiconductor devices is of major importance in industrial and automotive power applications. Traditionally, qualification tests, like the HTOL test, are carried out in a semi-automated manner. This paper first r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::556f05e1d5129324afe36b36e8a0a2e5
https://doi.org/10.23919/epe17ecceeurope.2017.8098933
https://doi.org/10.23919/epe17ecceeurope.2017.8098933
Publikováno v:
2016 IEEE Applied Power Electronics Conference and Exposition (APEC).
Reliability stress testing of power semiconductors requires significant development effort for a test apparatus to provide the required functionality. This paper presents a modular test system architecture which focuses on flexibility, reusability an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b049535200dff058a424bbdd378addb3
https://doi.org/10.1109/apec.2016.7467957
https://doi.org/10.1109/apec.2016.7467957
Publikováno v:
2008 IEEE Power Electronics Specialists Conference.
The short circuit robustness of smart power switches has become a major concern in automotive applications over the last years. This is reflected in a new extension to the AEC qualification standard Q100-12, where the basic requirements for short cir
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1973fcb25dbd37897577e9d3806767d2
https://doi.org/10.1109/pesc.2008.4592209
https://doi.org/10.1109/pesc.2008.4592209