Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Rohini Raghunathan"'
Publikováno v:
International Symposium for Testing and Failure Analysis.
This article analyzes the cause of Vcc shorts in advanced microprocessors. In one instance, an advanced microprocessor exhibited Vcc shorts at wafer sort in a unique pattern. The poly silicon was narrow in one section of the die. The gates were shown
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ca10f375585ad00ca4453cf35a11e4bb
https://doi.org/10.31399/asm.cp.istfa1998p0041
https://doi.org/10.31399/asm.cp.istfa1998p0041
Autor:
Rohini Raghunathan, Chris Carty, Kendall S. Wills, Jianbai Zhu, Philip Simon, Andy Vance, John H. Abbott, Charles P. Todd
Publikováno v:
International Symposium for Testing and Failure Analysis.
Flip Chip packaging requires an understanding of the solder bump metallurgy and its aging characteristics. In this paper we demonstrate how standard failure analysis techniques can help determine aging characteristics and, how an understanding of bum
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::526beca0f3d61d9a4032414cf1426b80
https://doi.org/10.31399/asm.cp.istfa1998p0413
https://doi.org/10.31399/asm.cp.istfa1998p0413
Publikováno v:
Circulation. 93:1601-1601
Figure 1. Top left. Chest radiograph of a 60-year-old man with acute cerebral infarction. The large, smoothly rounded, left hilar mass suggests a pulmonary artery aneurysm. Figure 2. Top right. Lateral view shows the mass to be in the middle mediasti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7a0bfbce658deab520d20e6da22409b9
https://doi.org/10.1161/01.cir.93.8.1601
https://doi.org/10.1161/01.cir.93.8.1601
Conference
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.