Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Roger Brees"'
Publikováno v:
2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).
A full-custom SoC was fabricated in 32nm SOI CMOS for the monolithic signal digitization of the signal coming from a 16-channel antenna array. In particular, the chip included multiple 3-bit 32GSps ADCs with DLL for time interleaving, and one 2GSps D
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a7c9a5acfd2c29029ac0817131b47522
https://doi.org/10.1109/nsrec.2018.8584314
https://doi.org/10.1109/nsrec.2018.8584314
Publikováno v:
IEEE Transactions on Nuclear Science. 62:1568-1576
This paper describes the ASIC Single Event Effects (SEE) Error Rate Tool (ASERT) methodology to estimate the error rates of complex System-on-Chip (SoC) devices. ASERT consists of a top-down analysis to divide the SoC into sensitive cell groups. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2aa2e4779393a9e1a6690f6d9699834a
https://doi.org/10.1109/tns.2015.2455027
https://doi.org/10.1109/tns.2015.2455027
Autor:
Manuel Cabanas-Holmen, Ethan H. Cannon, Joe Tostenrude, Roger Brees, Barry Meaker, Michael Carson, Charles Neathery
Publikováno v:
IEEE Transactions on Nuclear Science. 60:4207-4213
We describe a test structure architecture that allows at-speed Single Event Effects (SEE) testing on embedded memory arrays. The at-speed test structure enables identification of Multiple Cell Upsets (MCU), Multiple Bit Upsets (MBU), persistent error
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2f05b82d17a209d6cf916817cf9929bd
https://doi.org/10.1109/tns.2013.2288307
https://doi.org/10.1109/tns.2013.2288307
Autor:
Salim A. Rabaa, Jon Ballast, Ethan H. Cannon, Michael Carson, Tony Amort, Roger Brees, Duncan Lam, Manuel Cabanas-Holmen
Publikováno v:
IEEE Transactions on Nuclear Science. 60:4374-4380
We introduce the 32 nm SOI Boeing Interleaved Flip-Flop, which is based on the DICE topology with additional RHBD layout enhancements. Sensitive node pairs were separated by interleaving elements of the flip-flop cell, to attain the required SEU perf
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c4c8ec9408e7fc92d188b1dcec994cfb
https://doi.org/10.1109/tns.2013.2288090
https://doi.org/10.1109/tns.2013.2288090
Autor:
Ethan H. Cannon, T. Swann, A. J. Kleinosowski, Tony Amort, Roger Brees, J. Wert, Manuel Cabanas-Holmen, S. Fischer, Jon Ballast, Barry Meaker
Publikováno v:
IEEE Transactions on Nuclear Science. 58:2726-2733
We describe the approach used to calculate and verify on-orbit upset rates of radiation hardened microprocessors. System designers use these error rates to choose between microprocessors and add appropriate system-level recovery and redundancy.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c5741ff45c82d7289c1431857b255366
https://doi.org/10.1109/tns.2011.2168978
https://doi.org/10.1109/tns.2011.2168978
Autor:
Roger Brees, Warren Snapp, Jon Ballast, Tony Amort, Manuel Cabanas-Holmen, Steve Fischer, Ethan H. Cannon, Charles Neathery
Publikováno v:
2015 IEEE Aerospace Conference.
This paper describes a method for developing Radiation Hardened by Design (RHBD) multicore processor Integrated Circuits (ICs) that meet specific single-event error rate targets in space environments with minimal impacts on power, area, and speed.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e8ad09c202a91c734f4e4f75edfab9b8
https://doi.org/10.1109/aero.2015.7119216
https://doi.org/10.1109/aero.2015.7119216
Autor:
Ethan H. Cannon, Barry Meaker, E Normand, J. Wert, Roger Brees, Manuel Cabanas-Holmen, Jason Andrew Koehn, Tony Amort
Publikováno v:
IEEE Transactions on Nuclear Science.
We measure the sensitivity of different 90-nm SRAM cells to single-event upsets (SEUs) caused by heavy ions, high energy protons, and low energy protons. We discuss radiation hardened by design techniques that impact SEU sensitivity.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::873bc616447bf423499f03ec774ec179
https://doi.org/10.1109/tns.2010.2086482
https://doi.org/10.1109/tns.2010.2086482