Zobrazeno 1 - 10
of 50
pro vyhledávání: '"Rodrigo Possamai Bastos"'
Autor:
Rodrigo Possamai Bastos, Matheus Garay Trindade, Rafael Garibotti, Jonas Gava, Ricardo Reis, Luciano Ost
Publikováno v:
IEEE Transactions on Nuclear Science. 69:1683-1690
Publikováno v:
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, 2022, 69 (7), pp.1610-1617. ⟨10.1109/TNS.2022.3176676⟩
IEEE Transactions on Nuclear Science, 2022, 69 (7), pp.1610-1617. ⟨10.1109/TNS.2022.3176676⟩
International audience; This paper investigates and assesses neutron radiation effects on the attitude estimation (AE) processing, typically embedded in inertial navigation systems (INS) and upcoming autonomous things. Findings highlight the importan
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0a4e6895c25092f6b2ff7fe816c5e66e
https://hal.science/hal-03675920
https://hal.science/hal-03675920
Publikováno v:
Journal of Integrated Circuits and Systems. 8:89-97
Soft error resilience is an increasingly important requirement of integrated circuits realized in CMOS nanometer technologies. Among the several approaches, Bulk Built-in Current Sensors (BBICS) offer a promising solution as they are able to detect p
Autor:
Jonas Gava, Alex Hanneman, Geancarlo Abich, Rafael Garibotti, Sergio Cuenca-Asensi, Rodrigo Possamai Bastos, Ricardo Reis, Luciano Ost
Publikováno v:
IEEE Transactions on Nuclear Science. :1-1
Deep neural network (DNN) models are being deployed in safety-critical embedded devices for object identification, recognition, and even trajectory prediction. Optimised versions of such models, in particular the convolutional ones, are becoming incr
Publikováno v:
IEEE Transactions on Nuclear Science. :1-1
Autor:
Jonas Gava, Nicolas Moura, Joaquim Lucena, Vinicius Rocha, Rafael Garibotti, Ney Calazans, Sergio Cuenca-Asensi, Rodrigo Possamai Bastos, Ricardo Reis, Luciano Ost
Publikováno v:
IEEE Transactions on Nuclear Science. :1-1
Most safety-critical edge-computing devices rely on lightweight cryptography (LWC) algorithms to provide security at minimum power and performance overhead. LWC algorithms are traditionally embedded as a hardware component, but with the advance of th
Autor:
Fabio Benevenuti, Marcio M. Gonçalves, Evaldo Carlos F. Pereira, Rafael G. Vaz, Odair L. Gonçalez, Rodrigo Possamai Bastos, Manon Letiche, Fernanda L. Kastensmidt, José Rodrigo Azambuja
Publikováno v:
Microelectronics Reliability. 138:114738
Autor:
Vitor Bandeira, Luciano Ost, Rodrigo Possamai Bastos, Matheus Garay Trindade, Jack Sampford, Rafael Garibotti, Ricardo Reis
Publikováno v:
Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2021
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021)
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021), Oct 2021, Bordeaux, France
Microelectronics Reliability, Elsevier, 2021
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021)
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021), Oct 2021, Bordeaux, France
International audience; With the advance of autonomous systems, security is becoming the most crucial feature in different domains, highlighting the need for protection against potential attacks. Mitigation of these types of attacks can be achieved u
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5b3d5513bc1d6b3be0f24a23b4a2d1dd
https://hal.archives-ouvertes.fr/hal-03375914
https://hal.archives-ouvertes.fr/hal-03375914
Autor:
Ricardo Aquino Guazzelli, Thiago Ferreira de Paiva Leite, Laurent Fesquet, Matheus Garay Trindade, Rodrigo Possamai Bastos, Leonel Acunha Guimaraes
Publikováno v:
Journal of Electronic Testing
Journal of Electronic Testing, Springer Verlag, 2020
Journal of Electronic Testing, Springer Verlag, 2020
International audience; Clockless integrated circuits, as any type of integrated system, might today carry hardware Trojan (HT) circuits maliciously implanted in the designs during outsourced phases of fabrication. This paper proposes a testing techn
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7395de21979b54ba1c936a919fd11a58
https://hal.archives-ouvertes.fr/hal-02472910
https://hal.archives-ouvertes.fr/hal-02472910
Publikováno v:
Microelectronics Reliability. 78:190-196
Soft error resilience is an increasingly important requirement of integrated circuits realized in CMOS nanometer technologies. Among the several approaches, Bulk Built-in Current Sensors (BBICS) offer a promising solution able to detect particle stri