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pro vyhledávání: '"Rodophe Catrin"'
Autor:
Daniel Taroux, Olivier Rondeau, Philippe Cormont, Cédric Maunier, Rodophe Catrin, Sebastien Lambert, Jérôme Néauport
Publikováno v:
Classical Optics 2014.
Quantities of pollutants present in silica optics polished by MRF are measured with ICP-AES after wet chemical etching. Iron contamination is mostly confined in two µm thick layer at surface and decreases exponentially with depth.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::481b38d2fd06406e1ce059b0daccc229
https://doi.org/10.1364/oft.2014.om4b.2
https://doi.org/10.1364/oft.2014.om4b.2
