Automated Sample Preparation of Nanoscale Devices for FESEM.

Autor: Cerchiara, RR, Fischione, PE, Boccabella, MF, Robins, AC

Publikováno v: Microscopy & Microanalysis; Jul2009 Supplement 2, Vol. 15 Issue S2, p1076-1077, 2p

Precession technique and electron diffractometry as new tools for crystal structure analysis and chemical bonding determination.

Autor: Avilov A; Institute of Crystallography of Russian Academy of Sciences, Leninsky prosp. 59, Moscow 119333, Russian Federation. avilov@ns.crys.ras.ru , Kuligin K, Nicolopoulos S, Nickolskiy M, Boulahya K, Portillo J, Lepeshov G, Sobolev B, Collette JP, Martin N, Robins AC, Fischione P

Publikováno v: Ultramicroscopy [Ultramicroscopy] 2007 Jun-Jul; Vol. 107 (6-7), pp. 431-44. Date of Electronic Publication: 2006 Dec 20.