Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Robin Tan Teck Yung"'
Publikováno v:
2012 12th Annual Non-Volatile Memory Technology Symposium Proceedings.
In this paper, optimization and physical scaling of the SONOS ONO triple layer are extensively evaluated, with detailed characterization of the Flash cell behavior. Reliability tests have demonstrated high temperature endurance and long-term data ret
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4bb0534be4b7053f8b6d9f3981ec94ab
https://doi.org/10.1109/nvmts.2013.6632849
https://doi.org/10.1109/nvmts.2013.6632849
Publikováno v:
2012 12th Annual Non-Volatile Memory Technology Symposium Proceedings; 2012, p1-6, 6p