Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Robert van Rijsinge"'
Autor:
Bohan Yang, Cocoy Reyes, Cedric Mayor, Dave Singelée, Peter Cockburn, Ingrid Verbauwhede, Yervant Zorian, Vladimir Rozic, Mario Konijnenburg, Erik Jan Marinissen, Robert van Rijsinge, Ping-Hsuan Hsieh, Chih-Tsun Huang, Jeroen Delvaux
Publikováno v:
Proceedings-2016 21st IEEE European Test Symposium, ETS 2016
ETS
ETS
The semiconductor industry has been driving a major part of its growth through first the PC and more recently the mobile market. Unfortunately, the PC market is in decline and also the end of the growth curve for mobile products is in sight now that
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::85f24a4e7c9b77221b084e3cd321d8dd
https://doi.org/10.1109/ets.2016.7519331
https://doi.org/10.1109/ets.2016.7519331
Publikováno v:
Journal of Electronic Testing. 23:559-567
In this paper, a design-based structural testing method is presented to enable a fast, low cost test for a switched-resistor digital-to-analogue converter (DAC). A 24-bit stereo DAC is used to demonstrate this. After schematic-level simulations and e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::25eefa5070d65c3dec1321ebdafa9d83
https://doi.org/10.1007/s10836-007-5011-9
https://doi.org/10.1007/s10836-007-5011-9
