Výsledky vyhledávání - "Robert W. Odom"

In-depth and ion image analysis of minor and trace constituents in V–Cr–Ti alloy welds

Autor: Robert W. Odom, Martin L. Grossbeck

Publikováno v: Journal of Materials Research. 11:1923-1933

This paper describes the application of dynamic secondary ion mass spectrometry (SIMS) to the study of the chemistry of welds in V–Cr–Ti alloys and presents preliminary data on the distribution of minor and trace elements (H, C, N, O, P, S, and C

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::336bb91241f2a7c11279455e6e530502
https://doi.org/10.1557/jmr.1996.0243

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Matrix-Enhanced Secondary Ion Mass Spectrometry: A Method for Molecular Analysis of Solid Surfaces

Autor: Kuang Jen Wu, Robert W. Odom

Publikováno v: Analytical Chemistry. 68:873-882

A new methodology, matrix-enhanced secondary ion mass spectrometry (ME-SIMS), is reported for the molecular analysis of biomaterials. The technique applies static secondary ion mass spectrometry (SSIMS) techniques to samples prepared in a solid organ

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1a417fb36ff7a203af45be6a9304c55e
https://doi.org/10.1021/ac950717i

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In situ analysis of organic monolayers and their reactivity on single micrometer-sized particles by time-of-flight secondary ion mass spectrometry

Autor: Thomas F. Fister, Richard W. Linton, Robert W. Odom, Kristie L. Willett, Gregory S. Strossman

Publikováno v: International Journal of Mass Spectrometry and Ion Processes. 143:87-111

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was used to study submonolayers of organic compounds of environmental significance adsorbed on coal flyash particles. Through the use of mass-resolved secondary ion images and mass spectra, ch

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::6e375a167a1edbf44d4eff6fa828d0de
https://doi.org/10.1016/0168-1176(95)04117-4

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Secondary Ion Mass Spectrometry Imaging

Autor: Robert W. Odom

Publikováno v: Applied Spectroscopy Reviews. 29:67-116

Introduction Secondary ion mass spectrometry (SIMS) is a chemical analysis technique that employs mass spectrometry to analyze solid and low volatility liquid samples [1]. Although there are numerous configurations of SIMS instrumentation, the fundam

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::a74ee74706c1d2c0c36c575ae3100d72
https://doi.org/10.1080/05704929408000898

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Nondestructive imaging detectors for energetic particle beams

Autor: Robert W. Odom, S.E. Buttrill, Michael D. Strathman, Scott M. Baumann

Publikováno v: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 44:465-472

This paper describes the design and discusses initial experimental results produced from a nondestructive, position sensitive particle beam detector. The detector measures the spatial and intensity distribution of a particle beam by determining the p

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::260619ee87072de4e5d6a973f6a3528b
https://doi.org/10.1016/0168-583x(90)90010-r

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Organic polymer analysis by laser ionization mass spectrometry and pattern recognition techniques

Autor: Kent J. Voorhees, Peter de B. Harrington, Robert W. Odom, Filippo. Radicati di Brozolo

Publikováno v: Scopus-Elsevier

Results obtained by combining pattern recognition techniques with the organic microanalysis capability of laser ionization mass spectrometry (LIMS) for identifying and classifying the mass spectra produced from 19 different polymer formulations are r

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::697ba69223c444c9531454dc6cf7e5f9
https://doi.org/10.1002/app.1990.070410731

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Accurate Modeling of Residual recoil-mixing during SIMS Measurements

Autor: Ming Hong Yang, Robert W. Odom

Publikováno v: MRS Proceedings. 669

Secondary ion mass spectrometry (SIMS) is an effective and powerful analytical technique, widely used in accurately determining dopant distributions (depth profiles). However, primary ion beam induced mass transport (ion mixing), especially the resid

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::239b18d3e9d438636d8032e79f1abd14
https://doi.org/10.1557/proc-669-j4.16

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State-of-the-Art X-Ray Photoelectron Spectroscopy (XPS): Conventional and Synchrotron X-Ray Sources for Micro-XPS

Autor: G.D. Ackermann, Zahid Hussain, Edward L. Principe, Howard A. Padmore, A.L. Johnson, Robert W. Odom

Publikováno v: MRS Proceedings. 524

This paper presents preliminary data on analyses of selected materials using two state-ofthe- art XPS systems: the Physical Electronics Inc. (PHI, Eden Prairie, MN) Quantum 2000 instrument and the microXPS beamline (7.3.2.1) at the Advanced Light Sou

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::be4250ef9353199e61b1589773a8f8f7
https://doi.org/10.1557/proc-524-221

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Direct Surface Analysis of Organic Contamination for Semiconductor Related Materials

Autor: G. S. Strossman, P. M. Lindley, J.J. Lee, Robert W. Odom

Publikováno v: MRS Proceedings. 386

Direct surface analysis of Si wafers and environmental materials such as polymers for wafer carriers and for high purity water systems is important to identify contaminants and their sources. Organic contaminants on the surfaces are difficult to anal

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3dabcd65cce73befc9021947ea48b1d1
https://doi.org/10.1557/proc-386-143

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