Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Robert T. Benoit"'
Autor:
Robert H. Brown, Roger V. Yelle, David Thomas, Patricia Beauchamp, Meemong Lee, David H. Rodgers, Robert T. Benoit, Gun Shing Chen, Laurence A. Soderblom, Bill R. Sandel
Publikováno v:
Space Science Reviews. 129:309-326
MICAS is an integrated multi-channel instrument that includes an ultraviolet imaging spectrometer (80–185 nm), two high-resolution visible imagers (10–20 μrad/pixel, 400–900 nm), and a short-wavelength infrared imaging spectrometer (1250–260
Autor:
Dexter Wang, Stanley W. Petrick, Bill R. Sandel, Robert H. Brown, George Fraschetti, Roger V. Yelle, Gun Shing Chen, Laurance A. Soderblom, Robert T. Benoit, Cesar A. Sepulveda, Patricia Beauchamp, Michael P. Crisp, David H. Rodgers, Stanley L. Soll, Carl F. Bruce, J. M. Davidson
Publikováno v:
SPIE Proceedings.
The planetary integrated camera-spectrometer, PICS, is a highly integrated sensor system which performs the functions of three optical instruments: a near infrared (IR) spectrometer, a visible imaging camera, and an ultraviolet (UV) spectrometer. Int
Autor:
Kent Johnson, D. Dean, James J. Gibson, James J. Guregian, Robert T. Benoit, Stephan D. Price, Gail E. Bingham, Richard M. Nadile, Harold A. B. Gardiner, Donald R. Smith, Ned B. Wheeler, Jack Griffin, Lynne R. Bates
Publikováno v:
SPIE Proceedings.
Efforts to reduce or eliminate contamination and off-axis leakage for the Cryogenic Infrared Radiance Instrument for the Shuttle (CIRRIS) 1A program flown on STS-39 are examined. The question of whether the Space Shuttle is a viable platform for spac
Publikováno v:
SPIE Proceedings.
An electroless nickel plated over aluminum mirror was tested for BRDF and surface profiles at two stages: First, after a standard polish for optical figure, and second, after a `super finishing process' which is designed to minimize optical scatter.
Publikováno v:
SPIE Proceedings.
The contamination control of telescopes with the straylight-rejection capability is reviewed to identify the degradative effects of contaminant phenomena on the measurements. Three levels of optical contamination are discussed including bidirectional
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