Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Robert Ritz"'
Autor:
H. Ryll, Heike Soltau, Martin Simson, Florian F. Krause, Knut Müller-Caspary, Dennis Marquardt, Robert Ritz, Marco Schowalter, Andreas Rosenauer, Oliver Oppermann, Martin Huth
Publikováno v:
Ultramicroscopy 223, 113221-(2021). doi:10.1016/j.ultramic.2021.113221
Modern quantitative TEM methods such as the ζ -factor technique require precise knowledge of the electron beam current. To this end, a macroscopic Faraday cup was designed and constructed. It can replace the viewing screen in the projection chamber
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::224c59da934c96a4ba7e10730384df86
https://hdl.handle.net/2128/28578
https://hdl.handle.net/2128/28578
Autor:
Tim Grieb, Martin Simson, Jan Müßener, Christoph Mahr, Marco Schowalter, Florian F. Krause, Robert Ritz, Martin Eickhoff, Knut Müller-Caspary, Andreas Rosenauer, Jörg Schörmann, Heike Soltau
Publikováno v:
Ultramicroscopy 228, 113321-(2021). doi:10.1016/j.ultramic.2021.113321
4D-scanning transmission electron microscopy (4D-STEM) can be used to measure electric fields such as atomic fields or polarization-induced electric fields in crystal heterostructures. The paper focuses on effects occurring in 4D-STEM at interfaces,
Autor:
Tim Grieb, Knut Müller-Caspary, Christoph Mahr, Marco Schowalter, Martin Simson, Andreas Rosenauer, Florian F. Krause, Arne Wittstock, Anastasia Lackmann, Heike Soltau, Robert Ritz
Publikováno v:
Ultramicroscopy. 196
Images acquired in transmission electron microscopes can be distorted for various reasons such as e.g. aberrations of the lenses of the imaging system or inaccuracies of the image recording system. This results in inaccuracies of measures obtained fr
Autor:
Sebastian Ihle, Florian Winkler, Martin Simson, Andreas Rosenauer, Tim O. Wehling, Vadim Migunov, Rafal E. Dunin-Borkowski, Malte Rösner, Hao Yang, Robert Ritz, Sandra Van Aert, Knut Müller-Caspary, Heike Soltau, Martial Duchamp, Martin Huth
Publikováno v:
Physical review / B 98(12), 121408 (2018). doi:10.1103/PhysRevB.98.121408
Physical review B
Physical review B
The charge density is among the most fundamental solid state properties determining bonding, electrical characteristics, and adsorption or catalysis at surfaces. While atomic-scale charge densities have as yet been retrieved by solid state theory, we
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0f0e517d2b959523943e30e7e037082a
https://hdl.handle.net/10356/89912
https://hdl.handle.net/10356/89912
Autor:
Martin Huth, Ian M. Griffiths, Robert Ritz, Peter D. Nellist, Colum M. O'Leary, Yukihito Kondo, Ryusuke Sagawa, Heike Soltau, Lothar Strüder, H. Ryll
Publikováno v:
Microscopy and Microanalysis. 25:1654-1655
Publikováno v:
Microscopy and Microanalysis. 25:40-41
Autor:
Martin Huth, Martin Simson, Chieko Hamamoto, Ryusuke Sagawa, Hiroki Hashiguchi, Heike Soltau, Yukihito Kondo, Robert Ritz
Publikováno v:
Microscopy and Microanalysis. 25:1694-1695
Autor:
Martin Huth, Gerardo T. Martinez, Martin Simson, Peter D. Nellist, Heike Soltau, Robert Ritz, Hiroki Hashiguchi, Ryusuke Sagawa, Thomas C. Isabell, Yukihito Kondo
Publikováno v:
Microscopy and Microanalysis. 24:198-199
Autor:
Martin Simson, Heike Soltau, Robert Hartmann, Lothar Strüder, H. Ryll, Peter D. Nellist, Ryusuke Sagawa, Yukihito Kondo, Martin Huth, Vadim Migunov, Rafal E. Dunin-Borkowski, Hao Yang, Julia Schmidt, Lewys Jones, Sebastian Ihle, Robert Ritz
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0f108d50a9d5970b33f7a70ce918aa98
https://doi.org/10.1002/9783527808465.emc2016.5295
https://doi.org/10.1002/9783527808465.emc2016.5295
Autor:
Heike Soltau, Rowan K. Leary, Rafal E. Dunin-Borkowski, Paul A. Midgley, Sebastian Ihle, Martial Duchamp, Julia Schmidt, Lothar Strüder, H. Ryll, Martin Huth, Duncan N. Johnstone, Robert Ritz, Vadim Migunov, Martin Simson
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b583f3e87cbf221aab94a7d23a401a34
https://doi.org/10.1002/9783527808465.emc2016.5224
https://doi.org/10.1002/9783527808465.emc2016.5224