Zobrazeno 1 - 10
of 48
pro vyhledávání: '"Robert R. Rye"'
Publikováno v:
Langmuir. 14:3937-3943
1-Heptanol flow in irregularly shaped surface grooves in Pd-coated Cu is shown to be an example of Poiseuille flow with simple Washburn kinetics of the form z{sup 2} = C({gamma}/{mu})t, where {gamma} is the liquid surface tension, {mu} is the viscosi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0353698916c3b30075bb880deb54917e
https://doi.org/10.1021/la9712247
https://doi.org/10.1021/la9712247
Publikováno v:
Acta Materialia. 45:5337-5345
Experiments are performed to observe capillary flow in grooves cut into copper surfaces. Flow kinetics of two liquids, 1-heptanol and eutectic Sn Pb solder, are modeled with modified Washburn kinetics and compared to flow data. It is shown that both
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dfe20302c17415ba78c4b86bc6bd1918
https://doi.org/10.1016/s1359-6454(97)00205-x
https://doi.org/10.1016/s1359-6454(97)00205-x
Publikováno v:
Langmuir. 13:2965-2972
Toluene solutions of monochlorosilane and trichlorosilane coupling agents are shown to react differently with hydrated and dry silicon surfaces. For typical hydrated surfaces produced by piranha (H2O2 + H2SO4) etching, the saturation coverages of oct
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1428ca2f7e805b9f4a59616c72f12b5a
https://doi.org/10.1021/la960919p
https://doi.org/10.1021/la960919p
Publikováno v:
Journal of Applied Physics. 79:1885-1890
The surfaces of virgin and chemically etched poly(tetrafluoroethylene) (PTFE) have been studied using scanning electron microscopy (SEM), and atomic force microscopy (AFM) in both contact and tapping modes. Contact mode AFM images of this relatively
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b3fc92636435a82eca97578da2b223be
https://doi.org/10.1063/1.361090
https://doi.org/10.1063/1.361090
Publikováno v:
Thin Solid Films. 262:73-83
Electroless or chemical vapor deposition of copper onto commercial samples of skived poly(tetrafluoroethylene) (PTFE) that have been chemically etched with sodium naphthalenide results in Cu films sufficiently adherent that attempts to remove the Cu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ca7e7e8fa94663b639a12bd7829cb5f0
https://doi.org/10.1016/0040-6090(95)05831-1
https://doi.org/10.1016/0040-6090(95)05831-1
Autor:
D. J. Rieger, A.J. Howard, Antonio J. Ricco, L. R. Sloan, Robert R. Rye, M. A. Mitchell, M. L. Lovejoy
Publikováno v:
Journal of The Electrochemical Society. 141:3556-3561
By combining conventional integrated-circuit processing techniques with chemical etching for strong Cu film adhesion, three processes for the fabrication of the fine (< 20 [mu]m, a factor of five smaller than existing technology), adherent conducting
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eefecf5dd2262d3b4d197caaff29f759
https://doi.org/10.1149/1.2059369
https://doi.org/10.1149/1.2059369
Autor:
Robert R. Rye
Publikováno v:
Journal of Polymer Science Part B: Polymer Physics. 32:1777-1785
Irradiation of thin commercial sheets of poly(tetrafluoroethylene) (PTFE) or a fluorinated ethylene-propylene copolymer (FEP) yield essentially the same results with mass spectroscopy or x-ray photoelectron spectroscopy (XPS). For both gas phase and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::252328ab6c9e6c1b6f80ce0ad6a27882
https://doi.org/10.1002/polb.1994.090321010
https://doi.org/10.1002/polb.1994.090321010
Publikováno v:
Journal of Applied Physics. 76:1228-1243
Modulated‐beam mass spectrometry and x‐ray photoelectron spectroscopy (XPS) have been used to investigate the interaction of CH4, C2H4, C5H10, and H2 with carburized and uncarburized tungsten. It is shown that significant evaporation of C1, C2, a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ca547b95e25ae68cfba516bbdc71bef6
https://doi.org/10.1063/1.357852
https://doi.org/10.1063/1.357852
Autor:
Robert R. Rye
Publikováno v:
Journal of Applied Physics. 76:1220-1227
Pure glassy carbon films [no x‐ray photoelectron spectroscopy (XPS) detectable impurities above the 0.5% level] as thick as 25 000 A have been grown on nearby silicon substrates (T≳100 °C) as a result of reactions between a hot tungsten filament
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4f2737bcfa6d9fa03dd5d297f09f90b3
https://doi.org/10.1063/1.357851
https://doi.org/10.1063/1.357851
Publikováno v:
Journal of The Electrochemical Society. 140:3233-3239
Using Rutherford backscattering spectroscopy (RBS) and x-ray photoelectron spectroscopy (XPS), the authors have shown that strong adhesion of electrolessly deposited Cu to etched poly(tetrafluoroethylene) (PTFE) results from penetration of all specie
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5098b79b8cbf693497b326eabe5f5e8a
https://doi.org/10.1149/1.2221016
https://doi.org/10.1149/1.2221016