Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Robert L. Billinger"'
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 54:1180-1189
We report precision measurements of the effective input noise temperature of a cryogenic (liquid-helium temperature) monolithic-microwave integrated-circuit amplifier at the amplifier reference planes within the cryostat. A method is given for charac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8d63034dde6c8e57554a8513d9095881
https://doi.org/10.1109/tmtt.2005.864107
https://doi.org/10.1109/tmtt.2005.864107
Publikováno v:
IEEE Transactions on Geoscience and Remote Sensing. 43:50-58
For a microwave total-power radiometer, we consider the error introduced by neglecting the difference in the antenna reflection coefficient between when it views a distant scene and when it views a nearby calibration target. An approximate expression
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2864b9b9daca808de7d9d6f1a983ab13
https://doi.org/10.1109/tgrs.2004.839809
https://doi.org/10.1109/tgrs.2004.839809
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 46:2620-2628
A set of wafer-probable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO. We review the methods for accurate measureme
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c43e23ac452fe5d1ff8b699c2404989e
https://doi.org/10.1109/22.739255
https://doi.org/10.1109/22.739255
Publikováno v:
2012 Conference on Precision electromagnetic Measurements.
We report a verification method for noise-temperature (NT) measurements on cryogenic low-noise amplifiers (LNAs) at liquid helium temperature. The method uses a comparison between the individual measurements of the LNA and an attenuator and the joint
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::062d40d4ca3a7a61cd3efbf03c57ba5f
https://doi.org/10.1109/cpem.2012.6250644
https://doi.org/10.1109/cpem.2012.6250644
Autor:
R. Direen, J. Randa, Derek Houtz, Robert L. Billinger, D.K. Walker, A.E. Cox, Dazhen Gu, K. MacReynolds
Publikováno v:
IGARSS
Accurate characterization of the brightness temperature (T B ) of black-body targets used for calibrating microwave remote-sensing radiometers includes many inputs: antenna pattern and loss, target temperature, target emissivity, mechanical alignment
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::010c0a0dcb303ee9c38d1d85cf0453cf
https://zenodo.org/record/1272767
https://zenodo.org/record/1272767
Publikováno v:
IGARSS
For a microwave total-power radiometer, we consider the error introduced by neglecting the difference in the antenna reflection coefficient between when it views a distant scene and when it views a nearby calibration target. An approximate expression
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8a48e0a689c7dd196158b417411e96f6
https://doi.org/10.1109/igarss.2004.1370662
https://doi.org/10.1109/igarss.2004.1370662
The NIST Noise Project has developed the theoretical formalism and experimental methods for performing accurate noise-temperature measurements on a wafer. This report summarizes the theoretical formulation and describes the design, methods, and resul
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4e6620e0ea1371be525adcf1b259079b
https://zenodo.org/record/1260799
https://zenodo.org/record/1260799
Publikováno v:
51st ARFTG Conference Digest.
A set of wafer probeable diode noise source transfer standards are characterized using on-wafer noise temperature methods developed recently at the National Institute of Standards and Technology (NIST). This paper reviews the methods for accurate on-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::68b913c3a5f9bbef310e5422151c04e2
https://doi.org/10.1109/arftg.1998.327277
https://doi.org/10.1109/arftg.1998.327277