Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Robert F, Spivey"'
Autor:
Zhubing Jia, Shilin Huang, Mingyu Kang, Ke Sun, Robert F. Spivey, Jungsang Kim, Kenneth R. Brown
In trapped-ion quantum computers, two-qubit entangling gates are generated by applying spin-dependent force which uses phonons to mediate interaction between the internal states of the ions. To maintain high-fidelity two-qubit gates under fluctuating
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cd253c6a354e94f50c38f52427f73eb3
Publikováno v:
PLoS ONE, Vol 10, Iss 6, p e0129804 (2015)
The matching hypothesis in social psychology claims that people are more likely to form a committed relationship with someone equally attractive. Previous works on stochastic models of human mate choice process indicate that patterns supporting the m
Externí odkaz:
https://doaj.org/article/a4daddd0080a4ce8947ec559b1ccbddd
Publikováno v:
Optics express. 27(23)
We report a highly efficient loading of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::ec1505fc374bc6ae32cbf1dd8a7aeb23
https://pubmed.ncbi.nlm.nih.gov/31878450
https://pubmed.ncbi.nlm.nih.gov/31878450
Publikováno v:
Thin Solid Films. 540:173-182
To model key aspects of surface morphology evolution and to overcome one of the main barriers to the implementation of extreme ultraviolet lithography in semiconductor processing, the 3D Monte Carlo simulation of ion-beam deposition on pit-type defec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3d3242ce8ecd1be9750655789575de7a
https://doi.org/10.1016/j.tsf.2013.06.017
https://doi.org/10.1016/j.tsf.2013.06.017
Publikováno v:
Scientific Reports
The evolution of thin film morphology during atmospheric pressure deposition has been studied utilizing Monte Carlo methods. Time invariant root-mean-squared roughness and local roughness morphology were both observed when employing a novel simulatio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7b176c1f888b349ff7dd1884ffd0de86
http://europepmc.org/articles/PMC4728611
http://europepmc.org/articles/PMC4728611
Development of 3D Monte Carlo simulations for predicting multilayer geometry of pit-type EUV defects
Publikováno v:
Extreme Ultraviolet (EUV) Lithography IV.
The EUV community has come to the conclusion that completely eliminating EUV mask defects will be nearly impossible in the near future. Instead the industry trend is to develop high performance optical simulations of the multilayer coating in order t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aa754e13eae40f1e1ae0199e9f758334
https://doi.org/10.1117/12.2011156
https://doi.org/10.1117/12.2011156
Autor:
Tung-Sheng Kuan, Yukta P. Timalsina, Robert F. Spivey, Andrew Horning, Toh-Ming Lu, Kim M. Lewis, Gwo-Ching Wang
Publikováno v:
Nanotechnology. 26:075704
The knowledge on the influence of surface roughness and the electron-phonon (el-ph) interaction on electrical transport properties of nanoscale metal films is important from both fundamental and technological points of view. Here we report a study of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::acce256f8d78d4b108b31b4252a75c16
https://doi.org/10.1088/0957-4484/26/7/075704
https://doi.org/10.1088/0957-4484/26/7/075704
Autor:
Yukta P Timalsina, Andrew Horning, Robert F Spivey, Kim M Lewis, Tung-Sheng Kuan, Gwo-Ching Wang, Toh-Ming Lu
Publikováno v:
Nanotechnology; 2/20/2015, Vol. 26 Issue 7, p1-1, 1p