Zobrazeno 1 - 10
of 90
pro vyhledávání: '"Robert B. Von Dreele"'
Autor:
James Weng, Wenqian Xu, Kamila M. Wiaderek, Olaf J. Borkiewicz, Jahui Chen, Robert B. Von Dreele, Leighanne C. Gallington, Uta Ruett
Publikováno v:
Journal of Synchrotron Radiation, Vol 30, Iss 3, Pp 546-554 (2023)
Flat-field calibration of X-ray area detectors is a challenge due to the inability to generate an X-ray flat-field at the selected photon energy the beamline operates at, which has a strong influence on the measurement behavior of the detector. A met
Externí odkaz:
https://doaj.org/article/5ea31ae366984e70838b34ee6029545b
Autor:
Dimitris P. Triandafillidis, Fotini Karavassili, Maria Spiliopoulou, Alexandros Valmas, Maria Athanasiadou, George Nikolaras, Stavroula Fili, Paraskevi Kontou, Matthew W. Bowler, Christos T. Chasapis, Robert B. Von Dreele, Andrew N. Fitch, Irene Margiolaki
Publikováno v:
Acta Crystallographica Section D Structural Biology. 79:374-386
The polymorphism of human insulin upon pH variation was characterized via X-ray powder diffraction, employing a crystallization protocol previously established for co-crystallization with phenolic derivatives. Two distinct rhombohedral (R3) polymorph
Autor:
Kazutaka Ikeda, Hidetoshi Ohshita, Toshiya Otomo, Kouji Sakaki, Hyunjeong Kim, Yumiko Nakamura, Akihiko Machida, Robert B. Von Dreele
Publikováno v:
Journal of Applied Crystallography. 55:1631-1639
In situ gas-loading sample holders for two-dimensionally arranged detectors in time-of-flight neutron total scattering experiments have been developed to investigate atomic arrangements during deuterium absorption using time and real-space resolution
Autor:
Chengfu Yang, Dongwei Ma, Jing Yang, Maykel Manawan, Ting Zhao, Yuanyuan Feng, Jiahui Li, Zhongzhu Liu, Yong‐Wei Zhang, Robert B. Von Dreele, Brian H. Toby, Carlos Ponce de León Albarrán, Jia Hong Pan
Publikováno v:
Advanced Functional Materials. 33
Autor:
Kazutaka, Ikeda, Hidetoshi, Ohshita, Toshiya, Otomo, Kouji, Sakaki, Hyunjeong, Kim, Yumiko, Nakamura, Akihiko, Machida, Robert B, Von Dreele
Publikováno v:
Journal of applied crystallography. 55(Pt 6)
Publikováno v:
Journal of Applied Crystallography. 54:3-6
The powder diffraction profile obtained with a pink-beam synchrotron X-ray source is described as the convolution of a back-to-back pair of exponentials convoluted with the Gaussian and Lorentzian components of a pseudo-Voigt. This new function is em
Autor:
Anthony K. Cheetham, Clare P. Grey, Robert J. Cava, Kent J. Griffith, Rogério M. Ribas, John B. Goodenough, Robson S. Monteiro, Yasuhiro Harada, Shun Egusa, Robert B. Von Dreele
Publikováno v:
Chemistry of Materials. 33:4-18
Lithium-ion batteries are essential for portable technology and are now poised to disrupt a century of combustion-based transportation. The electrification revolution could eliminate our reliance o...
Autor:
Robert B. Von Dreele, Maria Spiliopoulou, Andrew N. Fitch, Alexandros Valmas, Irene Margiolaki, Dimitris-Panagiotis Triandafillidis, Christos Kosinas
Publikováno v:
Crystal Growth & Design. 20:8101-8123
Powder X-ray diffraction (PXRD) has been employed extensively for the structural characterization of materials, quantitative analysis of multicomponent mixtures, phase identification, texture, and ...
Autor:
Robert B. Von Dreele, Wenqian Xu
Publikováno v:
Journal of Applied Crystallography. 53:1559-1561
An estimate of synchrotron hard X-ray incident beam polarization is obtained by partial two-dimensional image masking followed by integration. With the correct polarization applied to each pixel in the image, the resulting one-dimensional pattern sho
Publikováno v:
Journal of Synchrotron Radiation
Area detector calibration can be improved greatly by translating the detector to multiple distances from the sample.
Calibration of area detectors from powder diffraction standards is widely used at synchrotron beamlines. From a single diffracti
Calibration of area detectors from powder diffraction standards is widely used at synchrotron beamlines. From a single diffracti