Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Robby Prang"'
Autor:
Christoph Ruffing, Aaron Kobler, Eglantine Courtois-Manara, Robby Prang, Christian Kübel, Yulia Ivanisenko, Eberhard Kerscher
Publikováno v:
Metals, Vol 5, Iss 2, Pp 891-909 (2015)
The increased attention ultrafine grained (UFG) materials have received over the last decade has been inspired by their high strength in combination with a remarkable ductility, which is a promising combination for good fatigue properties. In this pa
Externí odkaz:
https://doaj.org/article/76d312e898e6406987959733b79c5a0c
Autor:
Stefan Walheim, Thomas Schimmel, Aaron Kobler, Tobias Klöffel, Torsten Scherer, Christian Kübel, Bernd Meyer, Horst Hahn, Thorsten Beuth, Markus Moosmann, Robby Prang, Erik Bitzek
Publikováno v:
Acta Materialia. 92:299-308
Ag nanowires have been manufactured with the ultrathin layer electrochemical deposition method. Transmission electron microscopy revealed a multiple twinned nanostructure that has not been reported in comparable structures using a non-template self-a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5d46515a29bd15ac92b0697dffd4f1fc
https://doi.org/10.1016/j.actamat.2015.02.041
https://doi.org/10.1016/j.actamat.2015.02.041
Publikováno v:
Practical Metallography. 46:292-302
Kurzfassung Es wird ein Verfahren vorgestellt, mit dessen Hilfe Defekte in siliziumbasierten Halbleiterbauelementen in allen drei Raumrichtungen für eine TEM-Untersuchung präpariert werden. Die Groblokalisierung der Defekte erfolgte zunächst durch
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a83f4df1f30c062d89848cf32f2be072
https://doi.org/10.3139/147.110009
https://doi.org/10.3139/147.110009
Autor:
Geoffrey A. Ozin, Julia Rinck, Torsten Scherer, Christian Kübel, Robby Prang, Annie K. Powell, Tobias Bocksrocker, Uli Lemmer, Florian Maier-Flaig
Publikováno v:
Nano letters. 13(8)
In this study, we investigate for the first time morphological and compositional changes of silicon quantum dot (SiQD) light-emitting diodes (SiLEDs) upon device operation. By means of advanced transmission electron microscopy (TEM) analysis includin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1c1260fc311bb204d724b7372ac4494e
https://pubmed.ncbi.nlm.nih.gov/23822764
https://pubmed.ncbi.nlm.nih.gov/23822764
Autor:
Wilhelm Pfleging, S. Heißler, Torsten Scherer, Peter G. Weidler, Hans Jürgen Seifert, Vanessa Oberst, R. Kohler, J. Pröll, Michael Bruns, Robby Prang, Christian Kübel
Publikováno v:
SPIE Proceedings.
The increasing need for long-life lithium-ion batteries requires the further development of electrode materials. Especially on the cathode side new materials or material composites are needed to increase the cycle lifetime. On the one hand, spinel-ty
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a44290148b576fdd79e50aea8d0d358a
https://doi.org/10.1117/12.2006373
https://doi.org/10.1117/12.2006373
Traceable and accurate reference dimensional metrology of nano-structures by scanning transmission electron microscopy (STEM) is introduced in the paper. Two methods, one based on the crystal lattice constant and the other based on the pitch of a fea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f8f5090f2c01abde6ab31126718a9d80
https://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&origin=inward&scp=84880705115
https://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&origin=inward&scp=84880705115
