Výsledky vyhledávání - "Robach, Chantal"

Akademický článek

Testability Analysis of Data-Flow Software

Autor: Nguyen, Thanh Binh, Delaunay, Michel, Robach, Chantal

Publikováno v: In Electronic Notes in Theoretical Computer Science 19 January 2005 116:213-225

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Akademický článek

From diagnosis to diagnosability: axiomatization, measurement and application

Autor: Le Traon, Yves, Ouabdesselam, Farid, Robach, Chantal, Baudry, Benoit

Publikováno v: In The Journal of Systems & Software 2003 65(1):31-50

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High-Speed Design-for-Test Architecture for Asynchronous NoC-based Systems-on-Chip

Autor: Tran, Xuan-Tu, Thonnart, Yvain, Durupt, Jean, Beroulle, Vincent, Robach, Chantal

Publikováno v: IEEE Transactions on Computers
IEEE Transactions on Computers, 2008, 10, pp.12
IEEE Transactions on Computers, Institute of Electrical and Electronics Engineers, 2008, 10, pp.12

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::17909d0f043534e8835f8b7af79b8603
https://hal.science/hal-01105282

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Compilation de programmes VHDL en vue de l'évaluation de testabilité d'équipements digitaux

Autor: Wodey, Pierre. Robach, Chantal.

Reproduction de : Thèse de doctorat : Informatique : Grenoble, INPG : 1993.
Titre provenant de l'écran-titre.

Externí odkaz: http://tel.archives-ouvertes.fr/tel-00343674

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Decreasing Test Qualification Time of AMS&RF Systems by using Normal Estimation

Autor: Joannon, Yves, Beroulle, Vincent, Robach, Chantal, Tedjini, Smail, Carbonero, J.L.

Publikováno v: IEEE Design & Test
IEEE Design & Test, IEEE, 2008, pp.0

International audience; The test cost of heterogeneous integrated circuits has significantly increased. So, the definition of relevant test methods and efficient test stimuli are becoming crucial research orientations for semiconductor manufacturers.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::17eab8cb2f1addf6c04eeda00905de65
https://hal.archives-ouvertes.fr/hal-00218160

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Integrating testability into the development process of reactive systems

Autor: Do, Huy Vu, Robach, Chantal, Delaunay, Michel

Publikováno v: Proceedings of the IASTED International Conference on Software Engineering SE 2007
The IASTED International Conference on Software Engineering SE 2007
The IASTED International Conference on Software Engineering SE 2007, Feb 2007, Innsbruck, Austria. pp.Track 552-155

International audience; In this paper, we present our approach to analyze the testability of data-flow designs of reactive systems. We use the SATAN technology which is based on the information theory to model the information transfer in the system.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::996969280b53ac04fb8620ca8b32bd55
https://hal.archives-ouvertes.fr/hal-00275887

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Using of Behavioral level AMS & RF Simulation for Validation Test Set Optimization

Autor: Joannon, Yves, Beroulle, Vincent, Robach, Chantal, Tedjini, Smail, Carbonero, Jean-Louis

Publikováno v: IEEE Wireless Test Workhop (WTW07)
6th IEEE Workshop on Test of Wireless Circuits and System
WTW'07
WTW'07, May 2007, Berkeley, United States. pp.62-67

International audience; The expansion of Wireless Systems-on-Chip leads to a rapid development of new design and test methods. In this paper, the test benches defined for design validation or characterization of AMS & RF SoCs are first optimized and

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::ed2969273f04d0445816d1771c48760c
https://hal.archives-ouvertes.fr/hal-00250420

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Génération de vecteurs de test pour les systèmes analogiques mixtes et RF

Autor: Joannon, Y., Beroulle, V., Robach, Chantal, Tedjini, S., Carbonero, J.L.

Publikováno v: "Ecole d'hiver Francophone sur les Technologies de Conception des systèmes embarqués Hétérogènes"
"Ecole d'hiver Francophone sur les Technologies de Conception des systèmes embarqués Hétérogènes", Jan 2007, France
Ecole d'hiver Francophone sur les Technologies de Conception des systèmes embarqués Hétérogènes (FETCH 2007)
Ecole d'hiver Francophone sur les Technologies de Conception des systèmes embarqués Hétérogènes (FETCH 2007), Jan 2007, Villard-de-Lans, France. pp.1

National audience; L'augmentation de la complexité des circuits intégrés mixtes et RF rend difficile leur test. Les défauts pouvant apparaître lors de la production de ces circuits sont plus difficilement observables et contrôlables. Plusieurs

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::f3deb299b928d2d6111870e63045f087
https://hal.archives-ouvertes.fr/hal-00261818

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