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pro vyhledávání: '"Rob R. Rutenbar"'
Publikováno v:
ICCAD
In this paper, we propose a new technique, referred to as virtual probe (VP), to efficiently measure, characterize and monitor both inter-die and spatially-correlated intra-die variations in nanoscale manufacturing process. VP exploits recent breakth
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::46302d56cd6358cbfd04d3eaea9ce270
https://doi.org/10.1145/1687399.1687481
https://doi.org/10.1145/1687399.1687481
