Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Riyadh Aziz Ghadban"'
Publikováno v:
Cogent Engineering, Vol 10, Iss 2 (2023)
AbstractThe current research utilizes a low voltage scanning electron microscopy (LV-SEM) with an electron beam along with low loading energy of lower than 2.2 KeV to minimize damage and specimen surface charging. The NovaSEM, is used as an efficient
Externí odkaz:
https://doaj.org/article/874bb653aff341d19334b11c3bbbff01
