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pro vyhledávání: '"Ritesh Turakhia"'
Autor:
Venkatesan Muthumalai, Rao Desineni, Nancy Bell, Ritesh Turakhia, Thomas Berndt, Aaron Sinnott, David Iverson
Publikováno v:
25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014).
Fast yield ramp is very important for a foundry during advanced process development and volume production. Logic and SRAM circuits are the major design blocks in advanced Integrated Circuits. Identification of systematic failures in logic and SRAM bl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a203b00c84db5bda437ceb26e9e77349
https://doi.org/10.1109/asmc.2014.6846945
https://doi.org/10.1109/asmc.2014.6846945
