Water splitting with silicon p-i-n superlattices suspended in solution.

Autor: Teitsworth TS; Department of Chemistry, University of North Carolina at Chapel Hill, Chapel Hill, NC, USA., Hill DJ; Department of Chemistry, University of North Carolina at Chapel Hill, Chapel Hill, NC, USA., Litvin SR; Department of Chemistry, University of North Carolina at Chapel Hill, Chapel Hill, NC, USA., Ritchie ET; Department of Chemistry, University of North Carolina at Chapel Hill, Chapel Hill, NC, USA., Park JS; Department of Chemistry, University of North Carolina at Chapel Hill, Chapel Hill, NC, USA., Custer JP Jr; Department of Chemistry, University of North Carolina at Chapel Hill, Chapel Hill, NC, USA., Taggart AD; Department of Chemistry, University of North Carolina at Chapel Hill, Chapel Hill, NC, USA., Bottum SR; Department of Chemistry, University of North Carolina at Chapel Hill, Chapel Hill, NC, USA., Morley SE; Department of Chemistry, University of North Carolina at Chapel Hill, Chapel Hill, NC, USA., Kim S; Department of Chemistry, University of North Carolina at Chapel Hill, Chapel Hill, NC, USA., McBride JR; Vanderbilt Institute of Nanoscale Science and Engineering, Vanderbilt University, Nashville, TN, USA., Atkin JM; Department of Chemistry, University of North Carolina at Chapel Hill, Chapel Hill, NC, USA., Cahoon JF; Department of Chemistry, University of North Carolina at Chapel Hill, Chapel Hill, NC, USA. jfcahoon@unc.edu.

Publikováno v: Nature [Nature] 2023 Feb; Vol. 614 (7947), pp. 270-274. Date of Electronic Publication: 2023 Feb 08.

Electrostatic tip effects in scanning probe microscopy of nanostructures.

Autor: Casper CB; Department of Chemistry, University of North Carolina, Chapel Hill, NC, United States of America., Ritchie ET; Department of Chemistry, University of North Carolina, Chapel Hill, NC, United States of America., Teitsworth TS; Department of Chemistry, University of North Carolina, Chapel Hill, NC, United States of America., Kabos P; National Institute of Standards and Technology, Boulder, CO, United States of America., Cahoon JF; Department of Chemistry, University of North Carolina, Chapel Hill, NC, United States of America., Berweger S; National Institute of Standards and Technology, Boulder, CO, United States of America., Atkin JM; Department of Chemistry, University of North Carolina, Chapel Hill, NC, United States of America.

Publikováno v: Nanotechnology [Nanotechnology] 2021 May 07; Vol. 32 (19), pp. 195710.

Mapping Free-Carriers in Multijunction Silicon Nanowires Using Infrared Near-Field Optical Microscopy.

Autor: Ritchie ET; Department of Chemistry, University of North Carolina at Chapel Hill , Chapel Hill, North Carolina 27599, United States., Hill DJ; Department of Chemistry, University of North Carolina at Chapel Hill , Chapel Hill, North Carolina 27599, United States., Mastin TM; Department of Chemistry, University of North Carolina at Chapel Hill , Chapel Hill, North Carolina 27599, United States., Deguzman PC; Center for Optoelectronics and Optical Communications, University of North Carolina at Charlotte , Charlotte, North Carolina 28223, United States., Cahoon JF; Department of Chemistry, University of North Carolina at Chapel Hill , Chapel Hill, North Carolina 27599, United States., Atkin JM; Department of Chemistry, University of North Carolina at Chapel Hill , Chapel Hill, North Carolina 27599, United States.

Publikováno v: Nano letters [Nano Lett] 2017 Nov 08; Vol. 17 (11), pp. 6591-6597. Date of Electronic Publication: 2017 Oct 30.