Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Ripan Kumar Biswas"'
Publikováno v:
AIP Advances, Vol 14, Iss 1, Pp 015025-015025-19 (2024)
We report results of Field Emission Scanning Electron Microscopy (FESEM), Energy Dispersive Analysis of X-rays (EDAX), X-ray Photoelectron Spectroscopy (XPS), X-ray Reflectivity (XRR), and X-ray Diffraction (XRD) and residual stress measurement studi
Externí odkaz:
https://doaj.org/article/e8af7a845cfa4024a2446226531bcc08
Publikováno v:
Micro & Nano Letters. 14:1204-1207
Barium titanate (BT) is extensively used in electronic industries for its high dielectric constant. However, the dielectric properties of BT significantly change due to carbonation at nanoscale. Commercially available tetragonal BT powder was milled