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Dual-wavelength point zig-zag scanning of zones on thin-layer chromatograms as a tool for quantitative assay

Autor: Rikuo Hira, Takashi Kurita, Kazuo Shibata, Kiyokazu Nakano, Hideki Makabe, Jugoro Suzuki, Hiroshi Yamamoto

Publikováno v: Journal of Chromatography A. 116:29-41

Dual-wavelength difference photometry has been applied to zones on chromatograsm. A zone was scanned, in two dimensions alternately, by two very narrow wavelength-selected pulses of light; the difference in the logarithm of the reflectance measuremen

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::9e38a1fe30ce07dcb4aa6fd72a46e961
https://doi.org/10.1016/s0021-9673(00)83697-3

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Direct quantitative measurement of the thinlayer chromatogram spots using the dual-wavelength and the zig-zag scanning method

Autor: Hiroshi Yamamoto, Jugoro Suzuki, Takashi Kurita, Hideki Makabe, Rikuo Hira

Publikováno v: BUNSEKI KAGAKU. 23:133-142

二波長測光法と微小光束によるジグザグスキャニング法とを組み合わせた新しい方式のデンシトメーターを開発し,薄層クロマトプレート上に展開・分離したスポット成分を直接定量する

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::7e946d1bcca8cce7fbaaeac2162cef50
https://doi.org/10.2116/bunsekikagaku.23.133

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Linearization of the calibration curves in the thin layer densitometry based on the dual-wavelength and zigzag scanning method

Autor: Jugoro Suzuki, Rikuo Hira, Hiroshi Yamamoto, Hideki Makabe, Kiyokazu Nakano, Takashi Kurita

Publikováno v: BUNSEKI KAGAKU. 23:1016-1027

すでに報告した二波長・ジグザグスキャニング方式のデンシトメーターの特長を生かして,従来薄層デンシトメトリーにおけるネックであった検量線の非直線性を解消する検量線補正装置

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::d4561ad08c4b8a1a95843a4423a0194c
https://doi.org/10.2116/bunsekikagaku.23.1016

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