Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Rijks, T.G.S.M."'
Publikováno v:
Physical Review B: Condensed Matter, 56(1), 362-366. American Institute of Physics
The anisotropic magnetoresistance (AMR) has been measured for Ni80Fe20 thin films, with the magnetization vector rotating in the film plane as well as out of the film plane. The out-of-plane (OF) AMR is found to be considerably larger than the in-pla
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=narcis______::faa6162077dfa7c66160f84530fc0c6d
https://research.tue.nl/nl/publications/992a9cd7-d626-4257-8a1e-161128f903fa
https://research.tue.nl/nl/publications/992a9cd7-d626-4257-8a1e-161128f903fa
Autor:
Paillard, M., Puyatier, G., Rijks, T.G.S.M., Jourdain, A., Steeneken, P.G., van Beek, J.T.M., De Coster, J., Drevon, C., Tilmans, H.A.C., Cazaux, J.L.
Publikováno v:
2006 European Microwave Conference; 2006, p1068-1071, 4p
Autor:
Rijks, T.G.S.M., van Beek, J.T.M., Steeneken, P.G., Ulenaers, M.J.E., De Coster, J., Puers, R.
Publikováno v:
17th IEEE International Conference on Micro Electro Mechanical Systems. Maastricht MEMS 2004 Technical Digest; 2004, p777-780, 4p
Autor:
Rijks, T.G.S.M., van Beek, J.T.M., Ulenaers, M.J.E., De Coster, J., Puers, R., den Dekker, A., van Teeffelen, L.
Publikováno v:
ESSCIRC 2004 - 29th European Solid-State Circuits Conference (IEEE Cat. No.03EX705); 2003, p269-272, 4p
Publikováno v:
IEEE Transactions on Magnetics; 1995, Vol. 31 Issue 6, p3918-3920, 3p
Autor:
Rijks, T.G.S.M., Sour, R.L.H., Neerinck, D.G., De Veirman, A.E.M., Coehoorn, R., Kools, J.C.S., Gillies, M.F., de Jonge, W.J.M.
Publikováno v:
IEEE Transactions on Magnetics; 1995, Vol. 31 Issue 6, p3865-3867, 3p
Autor:
Folkerts, W., Kools, J.C.S., Rijks, T.G.S.M., Coehoorn, R., de Nooijer, M.C., Somers, G.H.J., Ruigrok, J.J.M., Postma, L.
Publikováno v:
IEEE Transactions on Magnetics; 1994, Vol. 30 Issue 6, p3813-3815, 3p
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Rijks, T.G.S.M., van Beek, J.T.M., Steeneken, P.G., Ulenaers, M.J.E., van Eerd, P., Den Toonder, J.M.J., van Dijken, A.R., De Coster, J., Puers, R., Weekamp, J.W., Scheer, J.M., Jourdain, A., Tilmans, H.A.C.
Publikováno v:
2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716); 2004, p49-49, 1p