Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Riewer, Olivia"'
Autor:
Benabboud, Youssef, Bosio, Alberto, Dilillo, Luigi, Girard, Patrick, Pravossoudovitch, Serge, Virazel, Arnaud, Riewer, Olivia, Izaute, Isabelle
Publikováno v:
18th IEEE Asian Test Symposium
ATS: Asian Test Symposium
ATS: Asian Test Symposium, Nov 2009, Taichung, Taiwan. pp.355-360
ATS: Asian Test Symposium
ATS: Asian Test Symposium, Nov 2009, Taichung, Taiwan. pp.355-360
International audience; The importance of delay faults proportionally increases when entering in the nano-technology era, and logic diagnosis must localize delay faults as precisely as possible to speed-up yield ramp-up. This paper presents a logic d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::605f346770f4d19ee979a15a744b9e3e
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00406968
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00406968
Autor:
Sturtevant, John L., Capodieci, Luigi, Le Denmat, Jean-Christophe, Feldman, Nelly, Riewer, Olivia, Yesilada, Emek, Vallet, Michel, Suzor, Christophe, Talluto, Salvatore
Publikováno v:
Proceedings of SPIE; March 2015, Vol. 9427 Issue: 1 p942705-942705-11
