Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Riemann, Till"'
Investigation of structural defects of thick GaN grown by flow-modulated hydride vapor-phase epitaxy
Autor:
Zhang, Wei *, Alves, Helder R., Riemann, Till, Heuken, M., Veit, Peter, Meister, Dirk, Kriegseis, Wilhelm, Hofmann, Detlev M., Christen, Juergen, Meyer, Bruno K.
Publikováno v:
In Physica B: Physics of Condensed Matter 2001 308:89-92
Autor:
Perlin, Piotr, Marona, Lucja, Swietlik, Tomasz, Leszczynski, Michal, Prystawko, Pawel, Wisniewski, Przemyslaw, Czernecki, Robert, Franssen, Gijs, Grzanka, Szymon, Kamler, Grzegorz, Borysiuk, Jola, Weyher, Janusz, Grzegory, Izabella, Suski, Tadeusz, Porowski, Sylwester, Riemann, Till, Christen, Jurgen
Publikováno v:
Proceedings of SPIE; Nov2005, Issue 1, p72-79, 8p
Autor:
Neubert, Barbara, Habel, Frank, Bruckner, Peter, Seholz, Ferdinand, Riemann, Till, Christen, Jürgen
Publikováno v:
MRS Online Proceedings Library; 2004, Vol. 831 Issue 1, p171-175, 5p
Autor:
Neubert, Barbara, Brückner, Peter, Habel, Frank, Scholz, Ferdinand, Riemann, Till, Christen, Jürgen, Beer, Martin, Zweck, Joseph
Publikováno v:
Applied Physics Letters; 10/31/2005, Vol. 87 Issue 18, p182111, 3p, 1 Black and White Photograph, 2 Graphs
Autor:
Siebentritt, Susanne, Beckers, Inge, Riemann, Till, Christen, Jürgen, Hoffmann, Axel, Dworzak, Matthias
Publikováno v:
Applied Physics Letters; 2/28/2005, Vol. 86 Issue 9, p091909, 3p, 1 Diagram, 1 Chart, 3 Graphs
Autor:
Zhang, Wei, Roesel, Stephan, Alves, Helder R., Meister, Dirk, Kriegseis, Wilhelm, Hofmann, Detlev M., Meyer, Bruno K., Riemann, Till, Veit, Peter, Blaesing, Juergen, Krost, Alois, Christen, Juergen
Publikováno v:
Applied Physics Letters; 2/5/2001, Vol. 78 Issue 6, p772, 3p, 3 Diagrams, 2 Charts, 2 Graphs
Autor:
Siebentritt, Susanne1 siebentritt@hmi.de, Beckers, Inge1, Riemann, Till2, Christen, Jürgen2, Hoffmann, Axel3, Dworzak, Matthias3
Publikováno v:
Applied Physics Letters. 2/28/2005, Vol. 86 Issue 9, p091909. 3p. 1 Diagram, 1 Chart, 3 Graphs.