Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Riel, M.C.J.M. van"'
Autor:
Reijzen, M.E. van, Tamer, M.S., Es, M.H. van, Riel, M.C.J.M. van, Keyvani Janbahan, A., Sadeghian Marnani, S., Lans, M.J. van der
Publikováno v:
Proceedings Metrology, Inspection, and Process Control for Microlithography XXXII, 2018, San Jose, CA, USA
In this paper, we present an AFM based subsurface measurement technique that can be used for overlay and critical dimensions (CD) measurements through optically opaque layers. The proposed method uses the surface elasticity map to resolve the presenc
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http://resolver.tudelft.nl/uuid:b3312949-6ae3-467a-952e-b209dce3360f
http://resolver.tudelft.nl/uuid:b3312949-6ae3-467a-952e-b209dce3360f
Publikováno v:
SID Semicon Innovation Day, Science Centre Delft, 21 May 2019
Scanning Subsurface Ultrasonic Force Microscopy (SSURFM) relies on high frequency ultrasound in combination with Atomic Force Microscopy to detect viscoelastic properties of buried materials with high spatial resolution. The key ingredient is a very
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::2c6abd61522686724c44d917726ed734
http://resolver.tudelft.nl/uuid:b5b08a3c-e8a7-4206-8a6e-bb808df000dc
http://resolver.tudelft.nl/uuid:b5b08a3c-e8a7-4206-8a6e-bb808df000dc
Autor:
Reijzen, M.E. van, Tamer, M.S., Es, M.H. van, Riel, M.C.J.M. van, Duivenvoorde, T., Keyvani Janbahan, A., Sadeghian Marnani, S., Lans, M.J van der
In the semiconductor industry, the need for characterization of subsurface features of wafers on a sub-nanometer level becomes ever more important. With Scanning Subsurface Probe Microscopy (SSPM), the smallest features can be measured with high reso
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::815f9f6803908e5dc1c29756de7eed22
http://resolver.tudelft.nl/uuid:fdb3a562-9074-4855-9542-e96198dd808e
http://resolver.tudelft.nl/uuid:fdb3a562-9074-4855-9542-e96198dd808e
Autor:
Neer, P.L.M.J. van, Riel, M.C.J.M. van, Es, M.H. van, Shoeibi Omrani, P.S., Hatakeyama, K., Mohtashami, A., Quesson, B.A.J., Lans, M.J. van der, Sadeghian Marnani, H.
Publikováno v:
SID Semicon Innovation Day, Science Centre Delft, 21 May 2019
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::ff69b126cccd0e9ad42bd9e313c82b3b
http://resolver.tudelft.nl/uuid:52aafe1a-7ec4-4879-ad8e-c47238f551d8
http://resolver.tudelft.nl/uuid:52aafe1a-7ec4-4879-ad8e-c47238f551d8
Autor:
Saathof, R., Crowcombe, W.E., Kuiper, S., Valk, N.C.J. van der, Pettazzi, F., Lange, T.J. de, Kerkhof, P.J., Riel, M.C.J.M. van, Man, H. de, Truyens, D.C., Ferrario, I.
Publikováno v:
Sodnik, Z.Karafolas, N.Cugny, B., Proceedings International Conference on Space Optics, ICSO 2018, 9-12 October 2018, Chania, Greece
Optical communications will complement radio frequency (RF) communications in the coming decades to enhance throughput, power efficiency and link security of satellite communication links. To enable optical communications technology for intersatellit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::71ad265a6c379d25593edeb8c1cf083c
http://resolver.tudelft.nl/uuid:7b641cfe-6ace-4fd6-b64c-e2641fadc1b4
http://resolver.tudelft.nl/uuid:7b641cfe-6ace-4fd6-b64c-e2641fadc1b4
Autor:
Kuiper, S., Doelman, N.J., Nieuwkoop, E., Overtoom, A.J., Russchenberg, T., Riel, M.C.J.M. van, Wildschut, J.A., Baeten, M.J.J., Human, J.D., Spruit, W.E.T., Brinkers, S., Maniscalco, M.P.
Publikováno v:
Navarro, R.Burge, J.H., Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II. 26 June-1 July 2016, 9912
Over the last decade TNO has developed a deformable mirror concept using electromagnetic actuators with the main advantages of having very low non-linearity and hysteresis, low power consumption, and high inherent reliability of the actuators. TNO re
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::17492daebe6cb7491d51a5de2f9f3a67
http://resolver.tudelft.nl/uuid:f9d0d209-84d6-4b7e-953b-2c12ed127251
http://resolver.tudelft.nl/uuid:f9d0d209-84d6-4b7e-953b-2c12ed127251