Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Rida Kheirallah"'
Publikováno v:
28th International Symposium on Power and Timing Modeling, Optimization and Simulation
PATMOS: Power And Timing Modeling, Optimization and Simulation
PATMOS: Power And Timing Modeling, Optimization and Simulation, Jul 2018, Platja d’Aro, Spain. pp.88-91, ⟨10.1109/PATMOS.2018.8464159⟩
PATMOS
PATMOS: Power And Timing Modeling, Optimization and Simulation
PATMOS: Power And Timing Modeling, Optimization and Simulation, Jul 2018, Platja d’Aro, Spain. pp.88-91, ⟨10.1109/PATMOS.2018.8464159⟩
PATMOS
International audience; For advanced technology nodes, static consumption of integrated circuits has become a key factor for the microelectronics industry. Circuit energy efficiency is measured in terms of delay performance and consumption. With the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c211887939220f1c5dd66637314c4323
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01867809
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01867809
Publikováno v:
Journal of Low Power Electronics
Journal of Low Power Electronics, American Scientific Publishers, 2016, 12 (1), pp.58-63. ⟨10.1166/jolpe.2016.1420⟩
Journal of Low Power Electronics, American Scientific Publishers, 2016, 12 (1), pp.58-63. ⟨10.1166/jolpe.2016.1420⟩
International audience; In this paper, we propose to study the impact of 28nm FDSOI technology on energy study. In fact, due to the effects of the Moore’s law, the process variations in current technologies are increasing and have a major impact on
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b9d1c607df3d23894bdf156de9e0ddfd
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01295833
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01295833
Publikováno v:
2015 International Workshop on CMOS Variability (VARI).
Due to the effects of the Moore's law, the process variations in current technologies are increasing and have a major impact on power and performance which results in parametric yield loss. Due to this, process variability and the difficulty of model
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f1f5889dd5871085f3cfafa4d7d620ca
https://doi.org/10.1109/vari.2015.7456558
https://doi.org/10.1109/vari.2015.7456558
Publikováno v:
16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems
EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems
EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2015, Budapest, Hungary. ⟨10.1109/EuroSimE.2015.7103149⟩
EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems
EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2015, Budapest, Hungary. ⟨10.1109/EuroSimE.2015.7103149⟩
International audience; Due to the effects of the Moore’s law, the process variations in current technologies are increasing and have a major impact on power and performance which results in parametric yield loss. Due to this, process variability a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d7912ce1bb639add06aae4aaccab2ff5
https://doi.org/10.1109/eurosime.2015.7103149
https://doi.org/10.1109/eurosime.2015.7103149