Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Rickard Liljedahl"'
Autor:
Ivan Gueorguiev Ivanov, Rickard Liljedahl, Rositsa Yakimova, G. Reza Yazdi, Valdas Jokubavicius, Mikael Syväjärvi
Publikováno v:
Crystal Growth & Design. 14:6514-6520
We introduce a 3C-SiC growth concept on off-oriented 4H-SiC substrates using a sublimation epitaxial method. A growth model of 3C-SiC layer development via a controlled cubic polytype nucleation on in situ formed on-axis area followed by a lateral en
Autor:
Milan Yazdanfar, Jr Tai Chen, Erik Janzén, Bjorn Lundqvist, Rickard Liljedahl, Nguyen Tien Son, Olle Kordina, Joel W. Ager, Ivan Gueorguiev Ivanov, Pontus Stenberg, Jawad ul Hassan
Publikováno v:
Materials Science Forum. :471-474
The optical properties of isotope-pure28Si12C, natural SiC and enriched with13C isotope samples of the 4H polytype are studied by means of Raman and photoluminescence spectroscopies. The phonon energies of the Raman active phonons at the Γ point and
Autor:
Mikael Syväjärvi, Peter J. Wellmann, Philip Hens, Valdas Jokubavicius, Rickard Liljedahl, Rositza Yakimova, Michl Kaiser
Publikováno v:
Materials Science Forum. :19-22
Fluorescent silicon carbide was grown using the fast sublimation growth process on low off-axis 6H-SiC substrates. In this case, the morphology of the epilayer and the incorporation of dopants are influenced by the Si/C ratio. Differently converted t
Autor:
Valdas Jokubavicius, Haiyan Ou, Mikael Syväjärvi, Margareta K. Linnarsson, Rickard Liljedahl, Michl Kaiser, Peter J. Wellmann, Yiyu Ou
Publikováno v:
Materials Science Forum. :397-400
Polycrystalline SiC containing boron and nitrogen are used in growth of fluorescent SiC for white LEDs. Two types of doped polycrystalline SiC have been studied in detail with secondary ion mass spectrometry: sintered SiC and poly-SiC prepared by sub
Autor:
Saskia Schimmel, Mikael Syväjärvi, Haiyan Ou, Margareta K. Linnarsson, Philip Hens, Peter J. Wellmann, Yiyu Ou, Rickard Liljedahl, Valdas Jakubavicius, Michl Kaiser, Rositza Yakimova, Jianwu Sun
Publikováno v:
Schimmel, S, Kaiser, M, Hens, P, Jokubavicus, V, Liljedahl, R, Sun, J W, Yakimova, R, Ou, Y, Ou, H, Linnarsson, M K, Wellmann, P & Syväjärvi, M 2012, ' Step-flow growth of fluorescent 4H-SiC layers on 4 degree off-axis substrates ', European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), Saint-Petersburg, Russian Federation, 02/09/2012-06/09/2012 .
Technical University of Denmark Orbit
Technical University of Denmark Orbit
Homoepitaxial layers of fluorescent 4H-SiC were grown on 4 degree off-axis substrates by sublimation epitaxy. Luminescence in the green spectral range was obtained by co-doping with nitrogen and boron utilizing donor-acceptor pair luminescence. This
Publikováno v:
Materials Science Forum. :201-204
The growth of homoepitaxial layers on off-oriented 6H-SiC substrates proceeds via step flow growth. Such epilayers can exhibit irregularities like step bunching, splicing or crossover of steps. The effects of the substrate off-orientation and growth
Autor:
Valdas Jokubavicius, Saskia Schimmel, Rickard Liljedahl, Mikael Syväjärvi, Ho Hsuan Huang, Rositza Yakimova
Publikováno v:
Materials Science Forum. :275-278
Bulk-like 3C-SiC was grown on 1.2 degrees low off-axis 6H-SiC substrates using a sublimation epitaxy technique. The effects of temperature ramp-up and increase in layer thickness on the 3C-SiC domain formation were explored. The temperature ramp-up h
Autor:
Rickard Liljedahl, Günter Wagner, Mikael Syväjärvi, Philip Hens, Julian M. Müller, Erdmann Spiecker
Publikováno v:
Materials Science Forum. :283-286
In this paper we present a concept on the defect generation and annihilation during the homoepitaxial growth step of cubic silicon carbide by sublimation epitaxy on templates grown by chemical vapor deposition on silicon substrates. Several structura
Autor:
Rickard Liljedahl, Philip Hens, Valdas Jokubavicius, Rositza Yakimova, Bjorn Lundqvist, Mikael Syväjärvi, Satoshi Kamiyama
Publikováno v:
Materials Science Forum. :193-196
Heteroepitaxial growth of 3C-SiC on 0.8 and 1.2 degree off-oriented 6H-SiC substrates was studied using a sublimation growth process. The 3C-SiC layers were grown at high growth rates with layer thickness up to 300 µm. The formation and the quality
Autor:
Philip Hens, Peter J. Wellmann, Erdmann Spiecker, Günter Wagner, Rositza Yakimova, Julian M. Müller, Mikael Syväjärvi, Rickard Liljedahl
Publikováno v:
Materials Science Forum. :177-180
In this work a new approach for the production of freestanding cubic silicon carbide (3C SiC) in (001) orientation is presented which is based on the combination of chemical vapor deposition (CVD) and the fast sublimation growth process (FSGP). Fast