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pro vyhledávání: '"Richard Schielein Stefan Schröpfer Markus Kiunke Simon Zabler Stefan Kasperl"'
Scattering of high energetic X ray photons causes artefacts in industrial computed tomography (CT). For MeV photons the interaction cross sections for scattering processes dominate those of the photoelectric effect and electron positron pair formatio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=snsf_p3_pubs::f2d577469e7133ea444f15f251dbe3e1
http://www.ndt.net/events/ECNDT2014/app/content/Paper/369_Schielein.pdf
http://www.ndt.net/events/ECNDT2014/app/content/Paper/369_Schielein.pdf
