Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Richard Schielein"'
Autor:
Tianyuan Wang, Virginia Florian, Richard Schielein, Christian Kretzer, Stefan Kasperl, Felix Lucka, Tristan van Leeuwen
Publikováno v:
Journal of Imaging, Vol 10, Iss 9, p 208 (2024)
Sparse-angle X-ray Computed Tomography (CT) plays a vital role in industrial quality control but leads to an inherent trade-off between scan time and reconstruction quality. Adaptive angle selection strategies try to improve upon this based on the id
Externí odkaz:
https://doaj.org/article/622094910521431e851d7b6c76a0b4e2
Autor:
Frank Sukowski, Daniel Rauch, Richard Schielein, Tobias Schön, Adrian Waldyra, Mara Fries, Andreas K. Maier, Linda-Sophie Schneider, Gabriel Herl, Simon Wittl, Simon Zabler, Sebastian Zeitel, Joshua Bissels, Christoph Becker
Publikováno v:
e-Journal of Nondestructive Testing, Vol 29, Iss 3 (2024)
Externí odkaz:
https://doaj.org/article/bfa0de3018724f648f00ca43420ba95e
Autor:
Virginia Florian, Christian Kretzer, Stefan Kasperl, Richard Schielein, Benjamin Montavon, Robert H. Schmitt
Publikováno v:
Research and Review Journal of Nondestructive Testing, Vol 1, Iss 1 (2023)
Computed tomography (CT) is a prominent technology for nondestructive quality control and is already used in industry for defect detection. However, as quality control is shifting towards a full in-line inspection, automatic CT analysis is required t
Externí odkaz:
https://doaj.org/article/63e3f83cfb2d4128876ba46079ad0b69
Autor:
Theobald O.J. Fuchs, Melanie Basting, Kilian Dremel, Markus Firsching, Stefan Kasperl, Thomas Lang, Dimitri Prjamkov, Richard Schielein, Simon Semmler, Daniel Suth, Mareike Weule
Publikováno v:
Research and Review Journal of Nondestructive Testing, Vol 1, Iss 1 (2023)
Quantum Computing (QC) technology has made tremendous progress recently. Today, first real QC systems are operational. The Fraunhofer Institute of Integrated Circuits IIS, Division Development Center X-ray Technology is participating in the project
Externí odkaz:
https://doaj.org/article/2707e5430cc84b35892ba17ce8885598
Autor:
P. Lhuissier, Richard Schielein, Simon Zabler, Randolf Hanke, Maximilian Ullherr, Berit Zeller-Plumhoff, Christian Fella, O. Focke, W. DeBoever
Publikováno v:
Nucl.Instrum.Meth.A
Nucl.Instrum.Meth.A, 2020, 951, pp.162992. ⟨10.1016/j.nima.2019.162992⟩
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Elsevier, 2020, 951, pp.162992. ⟨10.1016/j.nima.2019.162992⟩
Nucl.Instrum.Meth.A, 2020, 951, pp.162992. ⟨10.1016/j.nima.2019.162992⟩
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Elsevier, 2020, 951, pp.162992. ⟨10.1016/j.nima.2019.162992⟩
International audience; How to evaluate and compare image quality from different sub-micrometer (sub μ ) CT scans? A simple test phantom made of polymer microbeads is used for recording projection images as well as 13 CT scans in a number of commerc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dde09b4bf1dffead38cac6fa69a2a649
https://hal.archives-ouvertes.fr/hal-02221549
https://hal.archives-ouvertes.fr/hal-02221549
Autor:
Randolf Hanke, Astrid Hölzing, Urs Sennhauser, Richard Schielein, Alexander Flisch, Markus Kiunke, Jürgen Hofmann, Simon Zabler, Carina Stritt, Frank Sukowski, Stefan Kasperl
Publikováno v:
Nuclear Instruments and Methods in Physics Research B
This work compares two popular MC simulation frameworks ROSI (Roentgen Simulation) and GEANT4 (Geometry and Tracking in its fourth version) in the context of X-ray physics. The comparison will be performed with the help of a parameter study consideri
Publikováno v:
Journal of Imaging
Journal of Imaging, MDPI, 2018, 4 (5), pp.65. ⟨10.3390/jimaging4050065⟩
www.mdpi.com/journal/jimaging
Journal of Imaging; Volume 4; Issue 5; Pages: 65
Journal of Imaging 5 (4), 65. (2018)
Journal of Imaging, MDPI, 2018, 4 (5), pp.65. ⟨10.3390/jimaging4050065⟩
www.mdpi.com/journal/jimaging
Journal of Imaging; Volume 4; Issue 5; Pages: 65
Journal of Imaging 5 (4), 65. (2018)
International audience; One of the most challenging computer vision problems in the plant sciences is the segmentation of roots and soil in X-ray tomography. So far, this has been addressed using classical image analysis methods. In this paper, we ad
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e07fa00c82808be91acfb315a1b000ac
https://hal.inrae.fr/hal-02624298/file/2018_Douarre_J.Imaging_1.pdf
https://hal.inrae.fr/hal-02624298/file/2018_Douarre_J.Imaging_1.pdf
One of the most challenging computer vision problem in plant sciences is the segmentation of root and soil from X-ray tomography. So far, this has been addressed from classical image analysis methods. In this paper, we address this root/soil segmenta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::aadf33bab7703a64831e95ad786a54e5
https://doi.org/10.1101/071662
https://doi.org/10.1101/071662
A study is shown which is performed to enhance an existing deterministic X ray simulation method for nondestructive testing applications by including the effect of pair production and annihilation. Therefore a Monte Carlo simulation tool was used to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=snsf_p3_pubs::684ae4436e2da77cab4cabbb0ddb789e
http://www.ndt.net/events/ECNDT2014/app/content/Paper/361_Kiunke_Rev1.pdf
http://www.ndt.net/events/ECNDT2014/app/content/Paper/361_Kiunke_Rev1.pdf
Scattering of high energetic X ray photons causes artefacts in industrial computed tomography (CT). For MeV photons the interaction cross sections for scattering processes dominate those of the photoelectric effect and electron positron pair formatio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=snsf_p3_pubs::f2d577469e7133ea444f15f251dbe3e1
http://www.ndt.net/events/ECNDT2014/app/content/Paper/369_Schielein.pdf
http://www.ndt.net/events/ECNDT2014/app/content/Paper/369_Schielein.pdf