Zobrazeno 1 - 10
of 49
pro vyhledávání: '"Richard McWilliam"'
Publikováno v:
BMC Musculoskeletal Disorders, Vol 25, Iss 1, Pp 1-11 (2024)
Abstract Background In an ageing population, low impact fragility fractures are becoming increasingly common. However, fracture risk can be reduced where low bone density can be identified at an early stage. In this study we aim to demonstrate that I
Externí odkaz:
https://doaj.org/article/5f6b076db02f4020aed87f411e499cda
Autor:
S. Neda Naghshbandi, Liz Varga, Alan Purvis, Richard Mcwilliam, Edmondo Minisci, Massimiliano Vasile, Matthias Troffaes, Tabassom Sedighi, Weisi Guo, Ed Manley, David H. Jones
Publikováno v:
IEEE Access, Vol 8, Pp 87775-87799 (2020)
Uncertainty and interconnectedness in complex engineering and engineered systems such as power-grids and telecommunication networks are sources of vulnerability compromising the resilience of these systems. Conditions of uncertainty and interconnecte
Externí odkaz:
https://doaj.org/article/fd4f7035342a47eeb0faf22902d0efa4
Autor:
Harry Targett, Dominic Hutchinson, Richard Hartley, Richard McWilliam, Ben Lopez, Ben Crone, Stephen Bonner
Publikováno v:
Acta Radiologica. 64:563-571
Background Mobile chest X-ray (CXR) scans are performed within intensive treatment units (ITU) without anti-scatter grids for confirming tube and line hardware placement. Assessment is therefore challenging due to degraded subject contrast resulting
Autonomy has become a focal point for research and development in many industries. Whilst this was traditionally achieved by modelling self-engineering behaviours at the component-level, efforts are now being focused on the sub-system and system-leve
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::599afb19e0df5f94004e32dfc04e2468
https://dspace.lib.cranfield.ac.uk/handle/1826/16315
https://dspace.lib.cranfield.ac.uk/handle/1826/16315
Autor:
David H. Jones, Matthias C. M. Troffaes, Liz Varga, Richard McWilliam, Tabassom Sedighi, S. Neda Naghshbandi, Alan Purvis, Weisi Guo, Massimiliano Vasile, Ed Manley, Edmondo Minisci
Publikováno v:
IEEE Access, Vol 8, Pp 87775-87799 (2020)
Uncertainty and interconnectedness in complex engineering and engineered systems such as power-grids and telecommunication networks are sources of vulnerability compromising the resilience of these systems. Conditions of uncertainty and interconnecte
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ed3d1cb69a818c62e74f70b2ad92e99d
https://dspace.lib.cranfield.ac.uk/handle/1826/15626
https://dspace.lib.cranfield.ac.uk/handle/1826/15626
Publikováno v:
Microelectronics Reliability. 85:122-139
Self-engineering systems that are capable of repairing themselves in-situ without the need for human decision (or intervention) could be used to achieve zero-maintenance. This philosophy is synonymous to the way in which the human body heals and repa
Publikováno v:
DASC/PiCom/DataCom/CyberSciTech
The paper demonstrates a novel design for a stuck-at CMOS gate based on dual-purpose redundancy. It combines detection and mitigation against common stuck-at fault conditions to improve fault tolerance without the need to replicate the entire circuit
Publikováno v:
Proceedings of the Institution of Mechanical Engineers. Part B : journal of engineering manufacture, 2017, Vol.231(13), pp.2279-2290 [Peer Reviewed Journal]
Electronic systems are prone to failures, whether during manufacture or throughout their in-service lifetime. A number of design and fabrication techniques are presently employed that maintain an economical production yield. However, the cost of thro
Publikováno v:
Procedia CIRP, 2015, Vol.38, pp.283-288 [Peer Reviewed Journal]
The development of fault-detection and self-healing methods at both a hardware and software level in modern aircraft is an attractive prospect. However it is expensive to design and test these techniques using real aircraft. This paper appraises the
Publikováno v:
Procedia CIRP, 2015, Vol.38, pp.277-282 [Peer Reviewed Journal]
FPGAs are a ubiquitous electronic component utilised in a wide range of electronic systems across many industries. Almost all modern FPGAs employ SRAM based configuration memory elements which are susceptible to radiation induced soft errors. In high