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pro vyhledávání: '"Richard Kacprowicz"'
Publikováno v:
DATE
Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testing of multiple cores of a system-on-chip (SoC) in parallel during WLTBI leads to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f0de4fd25bd1af56c581c8c888b646d
https://doi.org/10.1145/1403375.1403640
https://doi.org/10.1145/1403375.1403640
Publikováno v:
ITC
The optimization of Intel Corporation's test process and test cost by the utilization of data from previous test steps and devices in order to make flow level and unit level testing decisions, including adaptive testing.. This optimization is externa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::380816a28b2c986e406dc1b9823a9eb3
https://doi.org/10.1109/test.2006.297649
https://doi.org/10.1109/test.2006.297649
Publikováno v:
2006 IEEE International Test Conference; 2006, p1-8, 8p