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pro vyhledávání: '"Richard Janek"'
Autor:
Pan Yang, Richard A. Gottscho, Thorsten Lill, Keren J. Kanarik, John D. Boniface, Andreas Fischer, Richard Janek, Vahid Vahedi
Publikováno v:
SPIE Proceedings.
In this paper, we report on plasma assisted thermal Atomic Layer Etching (ALE) of Al2O3. The surface was modified via a fluorine containing plasma without bias power. The removal was accomplished by a thermal reaction step using tin-(II) acetylaceton
Publikováno v:
ECS Transactions. 33:145-158
The morphology and behavior of thin Cu films deposited using electroless, electrolytic, and physical vapor deposition (PVD) is studied using Ru as a substrate. Ru was deposited by both PVD and atomic layer deposition (ALD). Electrolessly deposited Cu
Publikováno v:
ECS Meeting Abstracts. :1428-1428
not Available.