Zobrazeno 1 - 10
of 122
pro vyhledávání: '"Richard J. Matyi"'
Autor:
Avyaya J. Narasimham, Avery Green, Richard J. Matyi, Prasanna Khare, Tuan Vo, Alain Diebold, Vincent P. LaBella
Publikováno v:
AIP Advances, Vol 5, Iss 11, Pp 117107-117107-9 (2015)
A technique to deposit 5-20 nm thick β-phase W using a 2-second periodic pulse of 1 sccm-N2 gas on Si(001) and SiN(5 nm)/Si(001) substrates is reported. Resistivity, X-ray photoelectron spectroscopy and X-ray reflectivity were utilized to determine
Externí odkaz:
https://doaj.org/article/4401e3087de944c1a23bb80757f6845c
Autor:
Avyaya J. Narasimham, Manasa Medikonda, Akitomo Matsubayashi, Prasanna Khare, Hyuncher Chong, Richard J. Matyi, Alain Diebold, Vincent P. LaBella
Publikováno v:
AIP Advances, Vol 4, Iss 11, Pp 117139-117139-7 (2014)
A technique to fabricate 5 to 20 nm thick sputter deposited β W films on SiO2 and Si substrates is presented. This is achieved by growing tungsten on a 5 nm SiO2 layer or in an oxygen controlled environment by flowing 2 sccm of O2 during deposition.
Externí odkaz:
https://doaj.org/article/b830bdbc77664abdb81e4aabd1af5421
Autor:
Ashish R. Tanna, Mc Ben Joe Charles, Haley C. Royce, Richard J. Matyi, Scott L. Wallen, Sesha S. Srinivasan
Publikováno v:
MRS Advances. 6:575-582
Calcium magnesium carbonate, also known as dolomite, is dispersed throughout Florida as a constituent of phosphate-mined resources. The mineral is problematic in the phosphoric acid production of phosphate for agriculture and must be separated so tha
Autor:
Robert I. MacCuspie, Richard J. Matyi
Publikováno v:
IEEE Nanotechnology Magazine. 14:7-22
Tiered risk as sessment approaches for nanomaterial environmental health and safety (nanoEHS) require a detailed understanding of the size and the size distribution of the material being used. There are many metrological tools to choose from, each wi
Autor:
P. K. Shreeman, Richard J. Matyi
Publikováno v:
physica status solidi (a). 208:2533-2538
The statistical dynamical diffraction theory (SDDT) provides a method for performing high resolution X-ray diffraction (HRXRD) analyses from materials that contain high levels of structural imperfection. SDDT is implemented by combining kinematical a
Publikováno v:
Journal of Crystal Growth. 323:35-38
Metamorphic Al 0.7 Ga 0.3 As y Sb 1− y buffers on GaAs substrates to reduce defect density in the strained GaSb QW p-channels were developed by employing superlattice (SL) consisting of alternating 10 nm-thick layers with different As-contents. The
Publikováno v:
The Journal of Physical Chemistry C. 115:6283-6289
The kinetics of the hydrogen reaction on a nanocomposite film comprised of gold (Au) nanoparticles embedded within yttria-stabilized zirconia (YSZ) was determined through an analysis of the localiz...
Autor:
P. K. Shreeman, Richard J. Matyi
Publikováno v:
Journal of Applied Crystallography. 43:550-559
Statistical dynamic diffraction theory (SDDT) provides the ability to model defect-induced structures in high-resolution X-ray diffraction analyses by incorporating both coherent (dynamic) and incoherent (kinematic) scattering. Current treatments of
Autor:
Craig Higgins, Robert L. Brainard, Richard J. Matyi, Jacque Georger, Seth Kruger, Vimal K. Kamineni
Publikováno v:
Journal of Photopolymer Science and Technology. 23:699-707
The physical characterization of extreme ultraviolet (EUV) ultra-thin underlayers (ULs) and their effects on photoresist EUV lithographic performance was investigated. UL polymer compositions were modeled to identify polymer compositions that would e
Autor:
Alessio Lamperti, T. A. Lafford, Elza Bontempi, Michael Krumrey, Kenji Sakurai, T. Fujimoto, Silvia Milita, David Bowen, M. Meduna, Paolo Colombi, Alex Ulyanenkov, Claudia Wiemer, Chang-Hwan Chang, T. Ma, Mark Farnworth, Leonid Shabel'nikov, Matej Jergel, Dileep Agnihotri, Laura E. Depero, Richard J. Matyi, V. E. Asadchikov, A. van der Lee, A. Gibaud
Publikováno v:
Università degli Studi di Brescia-IRIS
Journal of applied crystallography 41 (2008): 143–152. doi:10.1107/S0021889807051904
info:cnr-pdr/source/autori:Colombi, P; Agnihotri, DK; Asadchikov, VE; Bontempi, E; Bowen, DK; Chang, CH; Depero, LE; Farnworth, M; Fujimoto, T; Gibaud, A; Jergel, M; Krumrey, M; Lafford, TA; Lamperti, A; Ma, T; Matyi, RJ; Meduna, M; Milita, S; Sakurai, K; Shabel'nikov, L; Ulyanenko; A. Van der Lee and C. Wiemer/titolo:Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment/doi:10.1107%2FS0021889807051904/rivista:Journal of applied crystallography/anno:2008/pagina_da:143/pagina_a:152/intervallo_pagine:143–152/volume:41
Journal of applied crystallography 41 (2008): 143–152. doi:10.1107/S0021889807051904
info:cnr-pdr/source/autori:Colombi, P; Agnihotri, DK; Asadchikov, VE; Bontempi, E; Bowen, DK; Chang, CH; Depero, LE; Farnworth, M; Fujimoto, T; Gibaud, A; Jergel, M; Krumrey, M; Lafford, TA; Lamperti, A; Ma, T; Matyi, RJ; Meduna, M; Milita, S; Sakurai, K; Shabel'nikov, L; Ulyanenko; A. Van der Lee and C. Wiemer/titolo:Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment/doi:10.1107%2FS0021889807051904/rivista:Journal of applied crystallography/anno:2008/pagina_da:143/pagina_a:152/intervallo_pagine:143–152/volume:41
X-ray reflectometry (XRR) is a well established technique to evaluate quantitatively electron density, thickness and roughness of thin layers. In this paper, results of the first world-wide XRR round-robin experiment, involving 20 laboratories, are p