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pro vyhledávání: '"Rich Berger"'
Autor:
Ken Sotoodeh, Wei-Lun Jen, Jordan Owens, Brook Chao, Bruce Wilks, D. Hale McMichael, Frank L. Palmieri, Ronald Carpio, C. Grant Willson, Ed Labelle, Joseph Pham, Jeff Wetzel, Rich Berger
Publikováno v:
SPIE Proceedings.
Step and Flash Imprint Lithography (S-FIL ® ) in conjunction with Sacrificial Imprint Materials (SIM) shows promise as a cost effective solution to patterning sub 45 nm features and is capable of simultaneously patterning two levels of interconnect
Autor:
Rich Berger
Publikováno v:
Klinische Wochenschrift. 5:1326-1326