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pro vyhledávání: '"Reza Gaemi"'
Publikováno v:
International Journal of Industrial Electronics, Control and Optimization, Vol 5, Iss 1, Pp 63-76 (2022)
In this paper, a two-level stacking technique with feature selection is used to detect power theft. The first level of this technique uses base classifiers such as support vector machine (SVM), naïve Bayes (NB), and AdaBoost selected by evaluating t
Externí odkaz:
https://doaj.org/article/fe8b0593136b4290be26016b087c67cb