Zobrazeno 1 - 10
of 27
pro vyhledávání: '"Retsu Oiwa"'
Autor:
Retsu Oiwa
Publikováno v:
Vacuum and Surface Science. 61:586-591
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3f1986e9e5f55bff244d502bd33c4773
https://doi.org/10.1380/vss.61.586
https://doi.org/10.1380/vss.61.586
Publikováno v:
Journal of Surface Analysis. 25:25-33
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::181f1212a8128b0508ffe438b52e2d25
https://doi.org/10.1384/jsa.25.25
https://doi.org/10.1384/jsa.25.25
Autor:
Retsu Oiwa, Takashi Sekiguchi
Publikováno v:
Vacuum and Surface Science. 63:552-553
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0c8210a5a1c58d0bf9d409736ecd2d1f
https://doi.org/10.1380/vss.63.552
https://doi.org/10.1380/vss.63.552
Publikováno v:
Hyomen Kagaku. 37:173-177
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e5a1ba02925136806870ed6b4a712987
https://doi.org/10.1380/jsssj.37.173
https://doi.org/10.1380/jsssj.37.173
Publikováno v:
Hyomen Kagaku. 25:217-223
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::06c81e17ba43925f572816fcff09d950
https://doi.org/10.1380/jsssj.25.217
https://doi.org/10.1380/jsssj.25.217
Publikováno v:
Applied Surface Science. :318-322
The use of ultra-low-energy SIMS for characterizing the shallow implants, such as boron and arsenic, is now widely employed. This article investigates the repeatability of SIMS analysis in shallow depth profile during a 6-month period. Using ultra-lo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ca3ab24e0c6c47a8c0720c88437b588c
https://doi.org/10.1016/s0169-4332(02)00668-2
https://doi.org/10.1016/s0169-4332(02)00668-2
Publikováno v:
Applied Surface Science. :323-328
Shallow arsenic implants and extra-thin film (SiON) are routinely analyzed by modem SIMS under ultra-low-energy Cs + ion beam bombardment, either at oblique (
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::34d5218da98d8e043872ce1830a31436
https://doi.org/10.1016/s0169-4332(02)00669-4
https://doi.org/10.1016/s0169-4332(02)00669-4
Autor:
Hideki Yoshikawa, Retsu Oiwa, Masato Okui, Masami Taguchi, Nobuhiro Yagi, Masaru Kitamura, Sei Fukushima, Vlaicu A. Mihai, Masahiro Kimura, Yoshiteru Kita, Katsumi Watanabe, Atsushi Nisawa, Akihiro Tanaka
Publikováno v:
Journal of Surface Analysis. 9:374-377
The 3rd generation synchrotron radiation (SR) facilities have been recently built and have given us high flux and wide-energy tunable X-ray. This characteristic is useful to obtain XPS spectra excited by the high energy X-ray, which reveals the deepe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7917b6119aacd816bc2732a6b012e7e2
https://doi.org/10.1384/jsa.9.374
https://doi.org/10.1384/jsa.9.374
Publikováno v:
Hyomen Kagaku. 20:791-798
Unintended degradation of specimens during X-ray irradiation is a very important phenomenon in quantifying the surfaces using X-ray photoelectron spectroscopy. However, there has been no practical method for quantitative evaluation of the degradation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::25c04e1db2312f1feefb2b829f5ed1f4
https://doi.org/10.1380/jsssj.20.791
https://doi.org/10.1380/jsssj.20.791
Publikováno v:
Fresenius' Journal of Analytical Chemistry. 362:254-257
In quantitative XPS, the preparation of reference samples is difficult or impossible, and the correction factor method has been employed. Therefore, a convenient and practical procedure to get correction factors to estimate atomic ratios is proposed,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5577bb4c308d9bb79262593309bdf4f5
https://doi.org/10.1007/s002160051069
https://doi.org/10.1007/s002160051069