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pro vyhledávání: '"Reto Pfeiffer"'
Autor:
Reto Pfeiffer
Gesucht wird in dieser Dissertation eine Antwort auf die Frage, was die «vertragliche Rechtsfolge» – also die Wirkung auf den Vertrag – ist, wenn Parteien einen Vertrag schliessen, der allgemeine Geschäftsbedingungen enthält, die nach Art. 8
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5443b6fe5e2d8aff6573e4dcc79b4989
https://doi.org/10.38107/023
https://doi.org/10.38107/023
Autor:
Carsten Winnewisser, Hans-Jörg Kirner, Reto Pfeiffer, Lukas Bürgi, Mathieu G. R. Turbiez, Frank Bienewald
Publikováno v:
Advanced Materials. 20:2217-2224
Publikováno v:
Organic Electronics. 7:114-120
An optical touch and proximity sensor based on polymer light-emitting diodes and polymer photodiodes is presented. The sensor’s thin-film light sources and detectors are monolithically integrated in the same plane of a common substrate and are proc
Publikováno v:
SPIE Proceedings.
With increasing demand for flat panel displays, which usually incorporate indium tin oxide (ITO) thin films, the price of indium will rise dramatically in the future. For simple and cheap applications (such as LogoLED™, see www.logoled.com) alterna
Autor:
L. B diaeru, Peter Metzler, Reto Pfeiffer, rgi, Carsten Winnewisser, cklich, M. M diaeru, Michael Kiy
Publikováno v:
SPIE Proceedings.
A polymer thin-film optical touch and proximity sensor is presented. The sensor is based on the monolithic integration of polymer light emitting diodes, logos or displays, and polymer photodiodes on a common substrate. The main interest in this new f
Submicrometer polymer transistors fabricated by a mask-free photolithographic self-alignment process
Publikováno v:
Applied Physics Letters. 92:153302
A simple method for patterning down to 400nm gaps between two thin-film electrodes is presented. The edge of the first electrode defines the gap via a photolithographic step using off-normal through-substrate exposure. It is demonstrated that the gap
Autor:
Bürgi, Lukas, Turbiez, Mathieu, Pfeiffer, Reto, Bienewald, Frank, Kirner, Hans-Jörg, Winnewisser, Carsten
Publikováno v:
Advanced Materials; Jun2008, Vol. 20 Issue 11, p2217-2224, 8p
Publikováno v:
Applied Physics Letters; 4/14/2008, Vol. 92 Issue 15, p153302, 3p, 1 Black and White Photograph, 1 Diagram, 1 Chart, 1 Graph