Zobrazeno 1 - 10
of 33
pro vyhledávání: '"Renliang Yuan"'
Autor:
Gangbin Yan, George Kim, Renliang Yuan, Eli Hoenig, Fengyuan Shi, Wenxiang Chen, Yu Han, Qian Chen, Jian-Min Zuo, Wei Chen, Chong Liu
Publikováno v:
Nature Communications, Vol 13, Iss 1, Pp 1-11 (2022)
Lithium extraction from dilute sources could help solve the lithium supply security issue. Here, the authors investigate the Li- and Na- ion co-intercalation behavior in iron phosphate electrodes and demonstrate the lithium selectivity control throug
Externí odkaz:
https://doaj.org/article/9156496559524444b9bfffe458a0a0c1
Autor:
Wenxiang Chen, Xun Zhan, Renliang Yuan, Saran Pidaparthy, Adrian Xiao Bin Yong, Hyosung An, Zhichu Tang, Kaijun Yin, Arghya Patra, Heonjae Jeong, Cheng Zhang, Kim Ta, Zachary W. Riedel, Ryan M. Stephens, Daniel P. Shoemaker, Hong Yang, Andrew A. Gewirth, Paul V. Braun, Elif Ertekin, Jian-Min Zuo, Qian Chen
Publikováno v:
Nature Materials. 22:92-99
Electrochemical phase transformation in ion-insertion crystalline electrodes is accompanied by compositional and structural changes, including the microstructural development of oriented phase domains. Previous studies have identified prevailingly tr
Publikováno v:
Microscopy Today. 30:24-29
The internal electric field of a 2D P-N junction of a semiconductor is mapped out by two techniques: measuring the deflection of the transmitted beam in micro-STEM mode with acquisition and data fitting of an un-scattered beam image, and through the
Autor:
Gaja Kobe, Colin Ophus, Elizabeth Koppany, Gary W. Paterson, Benjamin H. Savitzky, Emma Devine, Hristo Gergov, Kirsten McClymont, Jian-Min Zuo, Ian MacLaren, David Riley, Kirsten Forster, K. P. Harikrishnan, Renliang Yuan, Anjelo Narendran
Publikováno v:
Microscopy and Microanalysis. 27:2-5
Autor:
Khalid Hattar, Renliang Yuan, Jun Ma, David G. Cahill, Hyejin Jang, Jian-Min Zuo, Jin Gu Kang, Zhu Diao, Qun Yang, Paul V. Braun, Sanjiv Sinha
Publikováno v:
The Journal of Physical Chemistry C. 125:6897-6908
While there is no known fundamental lower limit to the thermal conductivity of a material, the lowest thermal conductivities are typically found in amorphous and strongly disordered materials, not ...
Publikováno v:
Microscopy and Microanalysis. 28:1762-1763
Publikováno v:
Microscopy and Microanalysis. 27:1276-1278
Autor:
Jian-Min Zuo, Renliang Yuan, Yu-Tsun Shao, Haw-Wen Hsiao, Saran Pidaparthy, Yang Hu, Qun Yang, Jiong Zhang
Transmission electron diffraction is a powerful and versatile structural probe for the characterization of a broad range of materials, from nanocrystalline thin films to single crystals. With recent developments in fast electron detectors and efficie
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::44516c13057d99d70e35fbd4b70fd8bb
http://arxiv.org/abs/2110.02070
http://arxiv.org/abs/2110.02070
Publikováno v:
Microscopy and Microanalysis. 26:978-980
The development of four-dimensional (4D) scanning transmission electron microscopy (STEM) using fast detectors has opened-up new avenues for addressing some of long-standing challenges in electron imaging. One of these challenges is how to image seve
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b1b967ef95200db8c62eb935322df82f