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Autor:
Roberto DeChecchi, Kristoffer Sander Skytte, Andrea Barletta, Mauro Merlo, Renato Castellan, Valentino Liberali, Mario Rotigni, Aurora Sanna, Paolo Colombo
Publikováno v:
2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo).
A dedicated test chip has been designed in order to support the study of the EMC performance, and more specifically the Conducted Emission, of a microcontroller family in M28 FDSOI technology. The focus in designing the test chip has been put on the