An Interactive micromanipulation station combined to a confocal XRF instrument : proof of concept and volume resolution

Autor: Tonneau, D., Renahy, D., Douillet, S., Maradj, H., Fauquet, C., Marchi, F.

Publikováno v: IEEEXplore Digital Library
IEEEXplore Digital Library, 2021, ⟨10.1109/MARSS49294.2020.9307924⟩

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______3430::ee449bcc6f7da0c9d2f9e1404e5945cd
https://hal.science/hal-03523732

Silicon nano-thermoelectric detectors for sensing and instrumentation applications

Autor: Varpula, A., Renahy, D., Grigoras, K., Timofeev, A. V., Shchepetov, A., Ahopelto, J., Gomès, S., Prunnila, M.

Publikováno v: Eurotherm 111: Nanoscale and Microscale Heat Transfer VI
Eurotherm 111: Nanoscale and Microscale Heat Transfer VI, Dec 2018, Levi, Finland

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::d96a6f68869749c5f6472da18ab02a32
https://hal.archives-ouvertes.fr/hal-02045307

Investigation of a topography-free composite sample using a combined scanning thermal microscopy/scanning electron microscopy instrument

Autor: Gomès, S., Guen, E., Renahy, D., Arpiainen, S., Weaver, J., Vincent, P., Chapuis, Pierre-Olivier, PRUNNILA, M.

Publikováno v: E-MRS May 2017, Altech
E-MRS May 2017, Altech, May 2017, Strasbourg, France

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::215f94be33c9a5b9559484e86b2eab33
https://hal.archives-ouvertes.fr/hal-02024073

First results with a combined SThM/SEM Instrument

Autor: Gomés, S., Renahy, D, PRUNNILA, M., Weaver, J., Vincent, P.

Publikováno v: Eurotherm 108: Nanoscale and Microscale Heat Transfer V
Eurotherm 108: Nanoscale and Microscale Heat Transfer V, Sep 2016, Santorini, Greece. Poster at International Eurotherm 108: Nanoscale and Microscale Heat Transfer V

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::5aac9ceeb7e3df7dfa2b301520b8fd2a
https://hal.archives-ouvertes.fr/hal-01475336

A Combined SThM/SEM Instrument For The Investigation Of Influent Parameters In Nano-scale Thermal Contact

Autor: Gomès, S., Renahy, D., Vincent, Pascal

Publikováno v: International Workshop on THERMAL INVESTIGATIONS of ICs and Systems
International Workshop on THERMAL INVESTIGATIONS of ICs and Systems, Sep 2015, Paris, France
Minicolloque Nanoconduction et Nanoradiation, [LRA] en Nanothermique
Minicolloque Nanoconduction et Nanoradiation, [LRA] en Nanothermique, Jul 2016, Lyon, France
Nanoscale 2016
Nanoscale 2016, Mar 2016, Wroclaw, Poland
Minicolloque Nanoconduction et Nanoradiation, Journées de la Matière Condensée
Minicolloque Nanoconduction et Nanoradiation, Journées de la Matière Condensée, Aug 2016, Bordeaux, France

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::08bedd79ac3fa9cd898c2695804a7704
https://hal.archives-ouvertes.fr/hal-01464803