Zobrazeno 1 - 10
of 41
pro vyhledávání: '"RenPu Li"'
Autor:
Imad Ali, Renpu Li, Khan Baz, Hashmat Ali, Shehryar Khan, Huaping Sun, Qamar Abbas, Adham E Ragab
Publikováno v:
Heliyon, Vol 10, Iss 1, Pp e23883- (2024)
The increasing trend in sustainable economic growth over the last few decades has elevated the energy demand, technological innovation, and access to minerals resources are contributing well to economic development. This article investigates the nexu
Externí odkaz:
https://doaj.org/article/42e7222231004780b85f38ec061e4ab2
Publikováno v:
Photonics, Vol 11, Iss 5, p 444 (2024)
High directional emission and high radiative quantum efficiency are strongly needed when moving a single optical nano-emitter (such as a quantum dot) into the practical realm. However, a typical optical nano-emitter struggles to meet the requirements
Externí odkaz:
https://doaj.org/article/f5e466677d3e49e2abf271c67c5fe78a
Publikováno v:
International Journal Bioautomation, Vol 24, Iss 2, Pp 117-130 (2020)
The relapse risk prediction for children with Henoch-Schönlein purpura can help pediatricians make an accurate prognosis and offer personalized and appropriate follow-up nursing and relapse control to patients. In this study, we propose a Genetic al
Externí odkaz:
https://doaj.org/article/616731252f324a1e914a293b31704bf7
Autor:
Renpu Li, Xiaojuan Qin, Igor Konyakhin, Minh Hoa Tong, Alexander Usik, Yongle Lu, Ke Di, Yu Liu
Publikováno v:
IEEE Access, Vol 8, Pp 51821-51829 (2020)
A complementary metal-oxide semiconductor (CMOS) multi-matrix-based optoelectronic system is proposed and studied to measure the deformation of each connection point of a large full-rotatable radio telescope. The system is based on 18 multi-matrix ba
Externí odkaz:
https://doaj.org/article/40504e708ceb4600892db771fddfb892
Publikováno v:
IEEE Access, Vol 7, Pp 150184-150202 (2019)
Smart contract security is an emerging research area that deals with security issues arising from the execution of smart contracts in a blockchain system. Generally, a smart contract is a piece of executable code that automatically runs on the blockc
Externí odkaz:
https://doaj.org/article/9bb2a313a7de45518b747547540b111c
Publikováno v:
Optoelectronics Letters. 19:210-214
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5c57faeb0a647a4ef67cd4c12f1591aa
https://doi.org/10.1007/s11801-023-2189-8
https://doi.org/10.1007/s11801-023-2189-8
Autor:
Xinhai Zou, Lei Liu, Ying Xu, Renpu Li, Lin Qi, Yu Liu, Yali Zhang, Zhiyao Zhang, Shangjian Zhang, Yong Liu
Publikováno v:
Journal of Lightwave Technology. 40:6745-6752
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::37f880a835b6efe8d394854746f8c63c
https://doi.org/10.1109/jlt.2022.3172332
https://doi.org/10.1109/jlt.2022.3172332
Publikováno v:
Optoelectronics Letters. 18:434-439
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::79654daf901994e236c1c370fab0c58f
https://doi.org/10.1007/s11801-022-2013-x
https://doi.org/10.1007/s11801-022-2013-x
Publikováno v:
Optoelectronics Letters. 18:91-96
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::831f30ea4eda9a9c2a37f44807429e37
https://doi.org/10.1007/s11801-022-1114-x
https://doi.org/10.1007/s11801-022-1114-x
Publikováno v:
Optical Metrology and Inspection for Industrial Applications IX.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::117333f488ab1e58150fa22c0f405116
https://doi.org/10.1117/12.2643763
https://doi.org/10.1117/12.2643763