Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Ren-Feng Ding"'
Autor:
Ren-Feng Ding, 丁仁峰
99
Precision positioning systems are extensively used in Scanning Probe Microscopy(SPM), nano-scale processing system and other domains. Precision positioning systems provide precise position control for tool or work piece. Besides the pursuit o
Precision positioning systems are extensively used in Scanning Probe Microscopy(SPM), nano-scale processing system and other domains. Precision positioning systems provide precise position control for tool or work piece. Besides the pursuit o
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/95043015770685837820
Autor:
Yi-Hsien Lu, Hsien-Chen Ko, Chung-Kai Fang, Ing-Shouh Hwang, Ren-Feng Ding, Chih-Wen Yang, Kwan-tai Leung
Publikováno v:
Scientific Reports, Vol 8, Iss 1, Pp 1-10 (2018)
Scientific Reports
Scientific Reports
Atomic force microscopy is used to conduct single-asperity friction measurements at a water-graphite interface. Local mapping of the frictional force, which is based on the degree of the cantilever twisting, shows nearly friction-free when a tip scan
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::98d5c16c799ffb682985d541e8eda6c9
http://link.springer.com/article/10.1038/s41598-018-21264-6
http://link.springer.com/article/10.1038/s41598-018-21264-6
Publikováno v:
Nanoscale. 8:18421-18427
In the operation of a dynamic mode atomic force microscope, a micro-fabricated rectangular cantilever is typically oscillated at or near its mechanical resonance frequency. Lateral bending resonances of cantilevers are rarely used because the resonan
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9dda32cb4714501e9ef0eeb4bdef04f0
https://doi.org/10.1039/c6nr04151e
https://doi.org/10.1039/c6nr04151e
Publikováno v:
Applied Surface Science. 522:146423
Force-distance (FD) curve-based atomic force microscopy (AFM) has been widely applied for characterizing the surface morphology and mechanical properties of soft materials at nanometer resolution. In this paper, we demonstrate FD curve-based AFM usin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::86bb1d7b0c5e2652a852b3422eeaa751
https://doi.org/10.1016/j.apsusc.2020.146423
https://doi.org/10.1016/j.apsusc.2020.146423
Autor:
Chia-Seng Chang, Wesley Wei-Wen Hsiao, Hsien-Shun Liao, Kuang-Yuh Huang, Ren-Feng Ding, Hsing-Hung Lin
Publikováno v:
Analytical Sciences. 29:3-8
Eukaryotic flagella are responsible for the motile organelles that cause the migration of mammalian sperms. The lashing force and torque of the sperm flagellum contain critical information regarding the sperm health, as important evaluation factors f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::96f0c5d8acb13e72d3100940a032b936
https://doi.org/10.2116/analsci.29.3
https://doi.org/10.2116/analsci.29.3
Publikováno v:
2015 IEEE International Conference on Mechatronics and Automation (ICMA).
As the well-grown of technology, manifold detecting functions have been developed on the surface measurement. By using diverse physical/chemical effects, the 3D surface profile measurement can be developed to detect the sample surface structure. Thro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1505253b9fc0b48cda38e3e70e65af04
https://doi.org/10.1109/icma.2015.7237818
https://doi.org/10.1109/icma.2015.7237818
Autor:
Hsien-Shun Liao, Kuang-Yuh Huang, Chih-Wen Yang, Ing-Shouh Hwang, Ren-Feng Ding, Chia-Seng Chang, Wei-Chiao Lai, Shih-Hsiu Lai
Publikováno v:
Nanotechnology. 24:305702
In this work, we present a design based on Lorentz force induction to excite pure torsional resonances of different types of cantilevers in air as well as in water. To demonstrate the atomic force microscopy imaging capability, the phase-modulation t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7152c836b3d9339b50993cbc852cda7b
https://doi.org/10.1088/0957-4484/24/30/305702
https://doi.org/10.1088/0957-4484/24/30/305702
Autor:
Chih-Wen Yang, Ren-Feng Ding, Shih-Hsiu Lai, Hsien-Shun Liao, Wei-Chiao Lai, Kuang-Yuh Huang, Chia-Seng Chang, Ing-Shouh Hwang
Publikováno v:
Nanotechnology; 2013, Vol. 24 Issue 30, p1-7, 7p