Výsledky vyhledávání - "Remy Chevallier"

TID and SEE Characterization of Rad-Hardened 1.2GHz PLL IP from New ST CMOS 65nm Space Technology

Autor: Gilles Gasiot, Philippe Roche, Laurent Dugoujon, Florence Malou, Remy Chevallier

Publikováno v: 2014 IEEE Radiation Effects Data Workshop (REDW).

We present Single Event Effects characterization and Total Ionizing Dose behavior up to 300 krad(Si) on Rad-Hardened 1.2GHz PLL IP and cold-spare I/O from new ST CMOS 65nm space technology.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::a71a7cab419cd634a5a175d3628d6345
https://doi.org/10.1109/redw.2014.7004601

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Statistical electrical and failure analysis of electromigration in advanced CMOS nodes for accurate design rules checker

Autor: E. Pion, P. Larre, D. Ney, Remy Chevallier, Vincent Huard, Thierry Parrassin, Damien Croain, Alain Bravaix, Anand Kumar Mishra, Xavier Federspiel

Publikováno v: 2013 IEEE International Reliability Physics Symposium (IRPS).

This paper introduces for the first time a new test structure for electromigration which allows increased statistics and reliability tests in a testchip under typical High Temperature Operating Life experimental ranges. Following the electrical analy

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::83af8a30aeb207174ae2a5ea1cd9a295
https://doi.org/10.1109/irps.2013.6532001

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Soft Oxide Breakdown impact on the functionality of a 40 nm SRAM memory

Autor: Saad Cheffah, Vincent Huard, Alain Bravaix, Remy Chevallier

Publikováno v: 2011 International Reliability Physics Symposium.

As CMOS technology continues to downscale to a deep submicron level (40 nm and beyond), Soft Oxide Breakdown (SBD) is becoming a real problem that could lead to a serious degradation in the performances and the functional operations of SoC. In this p

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::5e120bf8d9b132d83902d8c7553aa4f1
https://doi.org/10.1109/irps.2011.5784561

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Timed Verification of the Generic Architecture of a Memory Circuit Using Parametric Timed Automata

Autor: Remy Chevallier, Laurent Fribourg, Weiwen Xu, Emmanuelle Encrenaz-Tiphene

Publikováno v: Formal Methods in System Design
Formal Methods in System Design, Springer Verlag, 2009, 34 (1), pp.59-81. ⟨10.1007/s10703-008-0061-x⟩
Formal Methods in System Design, 2009, 34 (1), pp.59-81. ⟨10.1007/s10703-008-0061-x⟩

International audience; Using a variant of Clariso-Cortadella’s parametric method for verifying asynchronous circuits, we analyse some crucial timing behaviors of the architecture of SPSMALL memory, a commercial product of STMicroelectronics. Using

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::62a70cb4f78413f53abddeb8fc1476ad
https://hal.archives-ouvertes.fr/hal-01195912

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Verification of the Generic Architecture of a Memory Circuit Using Parametric Timed Automata

Autor: Remy Chevallier, Weiwen Xu, Laurent Fribourg, Emmanuelle Encrenaz-Tiphene

Publikováno v: Lecture Notes in Computer Science ISBN: 9783540450269
FORMATS

Using a variant of Clariso-Cortadella’s parametric method for verifying asynchronous circuits, we formally derive a set of linear constraints that ensure the correctness of some crucial timing behaviours of the architecture of SPSMALL memory. This

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::0d5ad7278c35d765befe2a0b19c42106
https://doi.org/10.1007/11867340_9

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Verification of behavioral descriptions by combining symbolic simulation and automatic reasoning

Autor: Dominique Borrione, Ghiath Al Sammane, Remy Chevallier

Publikováno v: ACM Great Lakes Symposium on VLSI

We present a property verification method for behavioral descriptions with TheoSim, a tool that combines symbolic simulation and automatic reasoning. The effectiveness of the method is illustrated on the verification of SPSMALL, a memory designed by

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3c97149ab1dd0b4c7578989b8b2c1802
https://doi.org/10.1145/1057661.1057724

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