Zobrazeno 1 - 10
of 1 273
pro vyhledávání: '"Remez R"'
Akademický článek
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Autor:
Shiloh R; School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv, Israel. Electronic address: royshilo@post.tau.ac.il., Remez R; School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv, Israel., Lu PH; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany., Jin L; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany., Lereah Y; School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv, Israel., Tavabi AH; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany., Dunin-Borkowski RE; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany., Arie A; School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv, Israel.
Publikováno v:
Ultramicroscopy [Ultramicroscopy] 2020 Sep; Vol. 216, pp. 112965. Date of Electronic Publication: 2020 May 12.
Publikováno v:
Optics letters [Opt Lett] 2020 May 01; Vol. 45 (9), pp. 2538-2541.
Autor:
Amitai M, Ben Baruch R, Ben-Dor DH, Ben-Ami D, Katz M, Sagy R, Remez R, Liav N, Leibovich M, Apter A, Weizman A, Zalsman G
Publikováno v:
Archives of suicide research : official journal of the International Academy for Suicide Research [Arch Suicide Res] 2020; Vol. 24 (sup2), pp. S202-S216. Date of Electronic Publication: 2019 Apr 30.
Publikováno v:
Optics express [Opt Express] 2019 Nov 25; Vol. 27 (24), pp. 34530-34541.
Autor:
Remez R; School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv 69978, Israel., Karnieli A; School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv 69978, Israel., Trajtenberg-Mills S; School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv 69978, Israel., Shapira N; School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv 69978, Israel., Kaminer I; Department of Electrical Engineering, Technion-Israel Institute of Technology, Haifa 32000, Israel., Lereah Y; School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv 69978, Israel., Arie A; School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv 69978, Israel.
Publikováno v:
Physical review letters [Phys Rev Lett] 2019 Aug 09; Vol. 123 (6), pp. 060401.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Shiloh R; School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv, Israel. Electronic address: royshilo@post.tau.ac.il., Remez R; School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv, Israel., Lu PH; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany., Jin L; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany., Lereah Y; School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv, Israel., Tavabi AH; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany., Dunin-Borkowski RE; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany., Arie A; School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv, Israel.
Publikováno v:
Ultramicroscopy [Ultramicroscopy] 2018 Jun; Vol. 189, pp. 46-53. Date of Electronic Publication: 2018 Mar 27.
Publikováno v:
Optics express [Opt Express] 2018 Jan 22; Vol. 26 (2), pp. 1433-1442.
Autor:
Addazi, Andrea1,2 (AUTHOR), Gan, Qingyu3,4 (AUTHOR) qy.gan@ssmeridionale.it
Publikováno v:
European Physical Journal C -- Particles & Fields. Jun2024, Vol. 84 Issue 6, p1-29. 29p.